Presentation 2010-10-19
Analysis on Critical Current Spread of Nb-AlO-Nb Josephson Junctions
Kenji HINODE, Tetsuro SATOH, Shuichi NAGASAWA, Mutsuo HIDAKA,
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Abstract(in English) We studied the spread of the critical current (I_c) for Nb-AlOx-Nb Josephson junctions. Room temperature measurements for the junction resistance gave the reasonable dependence of the JJ area. Low temperature measurements of IV characteristics for serial JJ arrays gave the I_c spreads consisting of two components, one is the JJ area component and the other is originated from the noise of the measurement system and test circuits. We proposed the model explaining the noise-origin I_c spread. Estimation based on the model showed good agreement with the measured JJ-size dependence.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) niobium / Josephson junction / critical current / SFQ / critical current spread / JJ area / noise
Paper # SCE2010-27
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Committee SCE
Conference Date 2010/10/12(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Analysis on Critical Current Spread of Nb-AlO-Nb Josephson Junctions
Sub Title (in English)
Keyword(1) niobium
Keyword(2) Josephson junction
Keyword(3) critical current
Keyword(4) SFQ
Keyword(5) critical current spread
Keyword(6) JJ area
Keyword(7) noise
1st Author's Name Kenji HINODE
1st Author's Affiliation International Superconductivity Technology Center()
2nd Author's Name Tetsuro SATOH
2nd Author's Affiliation International Superconductivity Technology Center
3rd Author's Name Shuichi NAGASAWA
3rd Author's Affiliation International Superconductivity Technology Center
4th Author's Name Mutsuo HIDAKA
4th Author's Affiliation International Superconductivity Technology Center
Date 2010-10-19
Paper # SCE2010-27
Volume (vol) vol.110
Number (no) 235
Page pp.pp.-
#Pages 6
Date of Issue