Presentation | 2010-08-26 Degradation phenomenon of electrical contacts by hammering oscillating mechanism : modeling of the oscillating mechanism (9) Shin-ichi WADA, Keiji KOSHIDA, Taketo SONODA, Saindaa NOROVLIN, Masayoshi KOTABE, Hiroaki KUBOTA, Koichiro SAWA, |
---|---|
PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studied the influences of a micro-oscillation on the contacts. In time & space fields, by combinations of unit step functions as external force, it was suggested that mathematical approach was able to be compared with experimental data using continuous approximation to a thin plate. In consideration of friction force & inertial force generated in connectors it was suggested that another model was able to be compared with experimental data and to explain the time series oscillation on the electrical contacts and the degradation phenomenon of electrical contacts. By making use of these models and by initial & boundary conditions, it was suggested that the approximate estimation of fundamental mechanical quantities, such as displacement, acceleration and mechanical energy was able to be carried out. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | electrical contact / degradation phenomenon / hammering oscillating mechanism / microoscillation / frictional force / inertial force / mathematical model |
Paper # | EMD2010-26,CPM2010-42,OPE2010-51,LQE2010-24 |
Date of Issue |
Conference Information | |
Committee | LQE |
---|---|
Conference Date | 2010/8/19(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | |
Chair | |
Vice Chair | |
Secretary | |
Assistant |
Paper Information | |
Registration To | Lasers and Quantum Electronics (LQE) |
---|---|
Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism : modeling of the oscillating mechanism (9) |
Sub Title (in English) | |
Keyword(1) | electrical contact |
Keyword(2) | degradation phenomenon |
Keyword(3) | hammering oscillating mechanism |
Keyword(4) | microoscillation |
Keyword(5) | frictional force |
Keyword(6) | inertial force |
Keyword(7) | mathematical model |
1st Author's Name | Shin-ichi WADA |
1st Author's Affiliation | TMC System Co., Ltd.() |
2nd Author's Name | Keiji KOSHIDA |
2nd Author's Affiliation | TMC System Co., Ltd. |
3rd Author's Name | Taketo SONODA |
3rd Author's Affiliation | TMC System Co., Ltd. |
4th Author's Name | Saindaa NOROVLIN |
4th Author's Affiliation | TMC System Co., Ltd. |
5th Author's Name | Masayoshi KOTABE |
5th Author's Affiliation | TMC System Co., Ltd. |
6th Author's Name | Hiroaki KUBOTA |
6th Author's Affiliation | TMC System Co., Ltd. |
7th Author's Name | Koichiro SAWA |
7th Author's Affiliation | Keio University:Nippon Institute of Technology |
Date | 2010-08-26 |
Paper # | EMD2010-26,CPM2010-42,OPE2010-51,LQE2010-24 |
Volume (vol) | vol.110 |
Number (no) | 181 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |