Presentation	2010-07-16 ESD waveform measurement with current probe and optical voltage probe Mikiya IIDA,
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Abstract(in English)	ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, it is important to measure ESD waveform on IC input terminals. We present a novel ESD measuring method using current probe and the optical voltage probe in this paper. We carried out experimentation to estimate the validity. The transfer characteristics of the probes, waveform when the ESD was applied to target plane and waveform when the ESD was applied to microstrip line substrate were measured respectively. The waveform measured by current probe showed good agreement with that by optical voltage probe and the validation of our measuring approach is confirmed.
Keyword(in Japanese)	(See Japanese page)
Keyword(in English)	ESD / Contact Discharge / IEC61000-4-2 / Microstrip Line / Current Probe / Optical Voltage Probe
Paper #	EMCJ2010-36,EMD2010-21
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Conference Information
Committee	EMD
Conference Date	2010/7/9(1days)
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Paper Information
Registration To	Electromechanical Devices (EMD)
Language	JPN
Title (in Japanese)	(See Japanese page)
Sub Title (in Japanese)	(See Japanese page)
Title (in English)	ESD waveform measurement with current probe and optical voltage probe
Sub Title (in English)
Keyword(1)	ESD
Keyword(2)	Contact Discharge
Keyword(3)	IEC61000-4-2
Keyword(4)	Microstrip Line
Keyword(5)	Current Probe
Keyword(6)	Optical Voltage Probe
1st Author's Name	Mikiya IIDA
1st Author's Affiliation	Toshiba Corporation Corporate Manufacturing Engineering Center()
Date	2010-07-16
Paper #	EMCJ2010-36,EMD2010-21
Volume (vol)	vol.110
Number (no)	133
Page	pp.pp.-
#Pages	6
Date of Issue