Presentation 2010-07-16
ESD waveform measurement with current probe and optical voltage probe
Mikiya IIDA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) ESD causes the malfunction of an electronic equipment. In order to clarify the ESD influence to malfunction mechanism, it is important to measure ESD waveform on IC input terminals. We present a novel ESD measuring method using current probe and the optical voltage probe in this paper. We carried out experimentation to estimate the validity. The transfer characteristics of the probes, waveform when the ESD was applied to target plane and waveform when the ESD was applied to microstrip line substrate were measured respectively. The waveform measured by current probe showed good agreement with that by optical voltage probe and the validation of our measuring approach is confirmed.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) ESD / Contact Discharge / IEC61000-4-2 / Microstrip Line / Current Probe / Optical Voltage Probe
Paper # EMCJ2010-36,EMD2010-21
Date of Issue

Conference Information
Committee EMD
Conference Date 2010/7/9(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Vice Chair

Paper Information
Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) ESD waveform measurement with current probe and optical voltage probe
Sub Title (in English)
Keyword(1) ESD
Keyword(2) Contact Discharge
Keyword(3) IEC61000-4-2
Keyword(4) Microstrip Line
Keyword(5) Current Probe
Keyword(6) Optical Voltage Probe
1st Author's Name Mikiya IIDA
1st Author's Affiliation Toshiba Corporation Corporate Manufacturing Engineering Center()
Date 2010-07-16
Paper # EMCJ2010-36,EMD2010-21
Volume (vol) vol.110
Number (no) 133
Page pp.pp.-
#Pages 6
Date of Issue