| Presentation | 2010-07-16 Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance (13) Shin-ichi WADA, Taketo SONODA, Keiji KOSHIDA, Saindaa NOROVLIN, Masayoshi KOTABE, Hiroaki KUBOTA, Koichiro SAWA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillation mechanism. In this paper, SD memory cards used in the mobile machinery for auxiliary storage unit were used as experimental materials because of the necessity of analysis about characteristics for oscillation. As a result of the experiment, it was shown that there was degradation phenomenon of electrical contacts after 20 millions hammerings and correlation between fluctuation of contact resistance and condition of contact surface. It was suggested that there was the influence on contact resistance by micro-vibration. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | electrical contact / micro-oscillation / contact resistance / hammering oscillating mechanism / contact force / SD memory card |
| Paper # | EMCJ2010-32,EMD2010-17 |
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| Conference Information | |
| Committee | EMD |
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| Conference Date | 2010/7/9(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Electromechanical Devices (EMD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance (13) |
| Sub Title (in English) | |
| Keyword(1) | electrical contact |
| Keyword(2) | micro-oscillation |
| Keyword(3) | contact resistance |
| Keyword(4) | hammering oscillating mechanism |
| Keyword(5) | contact force |
| Keyword(6) | SD memory card |
| 1st Author's Name | Shin-ichi WADA |
| 1st Author's Affiliation | TMC System Co., Ltd.() |
| 2nd Author's Name | Taketo SONODA |
| 2nd Author's Affiliation | TMC System Co., Ltd. |
| 3rd Author's Name | Keiji KOSHIDA |
| 3rd Author's Affiliation | TMC System Co., Ltd. |
| 4th Author's Name | Saindaa NOROVLIN |
| 4th Author's Affiliation | TMC System Co., Ltd. |
| 5th Author's Name | Masayoshi KOTABE |
| 5th Author's Affiliation | TMC System Co., Ltd. |
| 6th Author's Name | Hiroaki KUBOTA |
| 6th Author's Affiliation | TMC System Co., Ltd. |
| 7th Author's Name | Koichiro SAWA |
| 7th Author's Affiliation | Keio University:Nippon Institute of Technology |
| Date | 2010-07-16 |
| Paper # | EMCJ2010-32,EMD2010-17 |
| Volume (vol) | vol.110 |
| Number (no) | 133 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |