Presentation 2010-07-12
On the NIRS Emotion Analysis by with Semi-Parametric Statistics
Takumi SASE, Masahiro NAKAGAWA,
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Abstract(in English) Brain Affective Interface (BAI) technology is essential for humans that cannot express emotion properly such as ALS patients. Although Emotion Near Infrared-rays Analysis System (ENIAS) was developed to quantify human emotion non-invasively, it has taken much time for subject training. The purpose of this study is to estimate positions concerned with emotion and to reduce them by using semi-parametric statistics. We quantified NIRS signals at sensation-based affect by Hurst exponential estimated from R/S statistics. The result suggests that we can reduce measurement channels from 24 channels to 18 channels and that the training time become approximately half.
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Keyword(in English) BAI technology / NIRS / Semi-parametric statistics / Hurst exponetial / Emotion
Paper # NLP2010-29
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Conference Information
Committee NLP
Conference Date 2010/7/5(1days)
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Paper Information
Registration To Nonlinear Problems (NLP)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On the NIRS Emotion Analysis by with Semi-Parametric Statistics
Sub Title (in English)
Keyword(1) BAI technology
Keyword(2) NIRS
Keyword(3) Semi-parametric statistics
Keyword(4) Hurst exponetial
Keyword(5) Emotion
1st Author's Name Takumi SASE
1st Author's Affiliation Faculty of Engineering, Nagaoka University of Technology()
2nd Author's Name Masahiro NAKAGAWA
2nd Author's Affiliation Faculty of Engineering, Nagaoka University of Technology
Date 2010-07-12
Paper # NLP2010-29
Volume (vol) vol.110
Number (no) 122
Page pp.pp.-
#Pages 6
Date of Issue