Presentation 2010/8/19
Pattern Layout Methods of System LSI with SGT
Takahiro KODAMA, Shigeyoshi WATANABE,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) The pattern area reduction of inverter, NAND, and full adder with SGT and stacked SGT has been 'newly' estimated. Wring SGT and stacked SGT the pattern area can be drastically reduced compared with that of conventional planar transistor, SGT and stacked SGT are promising candidate for reeling high density system LSI.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) SGT / stacked SGT / system LSI / design rule / pattern area
Paper # ICD2010-64,SDM2010-149
Date of Issue

Conference Information
Committee ICD
Conference Date 2010/8/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Pattern Layout Methods of System LSI with SGT
Sub Title (in English)
Keyword(1) SGT
Keyword(2) stacked SGT
Keyword(3) system LSI
Keyword(4) design rule
Keyword(5) pattern area
1st Author's Name Takahiro KODAMA
1st Author's Affiliation ()
2nd Author's Name Shigeyoshi WATANABE
2nd Author's Affiliation
Date 2010/8/19
Paper # ICD2010-64,SDM2010-149
Volume (vol) vol.110
Number (no) 183
Page pp.pp.-
#Pages 6
Date of Issue