| Presentation | 2010/8/19 Post-manufacturing, 17-times Acceptable Raw Bit Error Rate Enhancement, Dynamic Codeword Transition ECC Scheme for Highly Reliable Solid-State Drives, SSD Shuhei TANAKAMARU, Atsushi ESUMI, Mitsuyoshi ITO, Kai LI, Ken TAKEUCHI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A dynamic codeword transition ECC scheme is proposed for highly reliable solid-state drives, SSDs. By monitoring the error number or the write/erase cycles, the ECC codeword dynamically increases from 512Byte (+parity) to 1KByte, 2KByte, 4KByte...32KByte. The proposed ECC with a larger codeword decreases the failure rate after ECC. Because the parity rate per codeword is the same in each ECC codeword, no additional memory area is required so that the reliability of SSD is improved after the manufacturing without cost penalty. Compared with the conventional ECC with the fixed large 32KByte codeword, the proposed scheme achieves a lower power consumption by introducing the "best-effort" type operation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ECC / Error correcting code / SSD / NAND Flash memory |
| Paper # | ICD2010-53,SDM2010-138 |
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| Conference Information | |
| Committee | ICD |
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| Conference Date | 2010/8/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Chair | |
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| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Post-manufacturing, 17-times Acceptable Raw Bit Error Rate Enhancement, Dynamic Codeword Transition ECC Scheme for Highly Reliable Solid-State Drives, SSD |
| Sub Title (in English) | |
| Keyword(1) | ECC |
| Keyword(2) | Error correcting code |
| Keyword(3) | SSD |
| Keyword(4) | NAND Flash memory |
| 1st Author's Name | Shuhei TANAKAMARU |
| 1st Author's Affiliation | Dept. of Electrical Engineering and Information Systems, University of Tokyo() |
| 2nd Author's Name | Atsushi ESUMI |
| 2nd Author's Affiliation | SIGLEAD Inc. |
| 3rd Author's Name | Mitsuyoshi ITO |
| 3rd Author's Affiliation | SIGLEAD Inc. |
| 4th Author's Name | Kai LI |
| 4th Author's Affiliation | SIGLEAD Inc. |
| 5th Author's Name | Ken TAKEUCHI |
| 5th Author's Affiliation | Dept. of Electrical Engineering and Information Systems, University of Tokyo |
| Date | 2010/8/19 |
| Paper # | ICD2010-53,SDM2010-138 |
| Volume (vol) | vol.110 |
| Number (no) | 183 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |