Presentation 2010/8/19
10bit-300MHz Double-Sampling Pipelined ADC with Digital Calibration for Memory Effects
Takuji MIKI, Takashi MORIE, Toshiaki OZEKI, Shiro DOSHO,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper describes an on-chip digital calibration technique to eliminate a memory effect error in Double-sampling Pipelined Analog to Digital Converters. In double-sampling pipelined ADC, one channel's output is affected by the other channel's adjacent output due to share an Op-amp with 2-channel Pipelined ADCs. To avoid this memory effect error, high gain Op-amp is required in conventional technique, but it causes high power consumption and large area of ADC. Therefore, we developed digital memory effect calibration techniques without using a high gain Op-amp. Since this technique fully performs in digital domain, power consumption and area of pipelined ADC becomes lower and smaller as miniaturization of CMOS process. This paper shows 10-bit 300MHz double-sampling pipelined ADC with on-chip digital calibration for memory effects fabricated with 45nm CMOS.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Pipelined ADCs / Double-sampling / Memory effect / Digital calibration
Paper # ICD2010-44,SDM2010-129
Date of Issue

Conference Information
Committee ICD
Conference Date 2010/8/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) 10bit-300MHz Double-Sampling Pipelined ADC with Digital Calibration for Memory Effects
Sub Title (in English)
Keyword(1) Pipelined ADCs
Keyword(2) Double-sampling
Keyword(3) Memory effect
Keyword(4) Digital calibration
1st Author's Name Takuji MIKI
1st Author's Affiliation Strategic Semiconductor Development Center, Panasonic Corporation()
2nd Author's Name Takashi MORIE
2nd Author's Affiliation Strategic Semiconductor Development Center, Panasonic Corporation
3rd Author's Name Toshiaki OZEKI
3rd Author's Affiliation Strategic Semiconductor Development Center, Panasonic Corporation
4th Author's Name Shiro DOSHO
4th Author's Affiliation Strategic Semiconductor Development Center, Panasonic Corporation
Date 2010/8/19
Paper # ICD2010-44,SDM2010-129
Volume (vol) vol.110
Number (no) 183
Page pp.pp.-
#Pages 6
Date of Issue