Presentation 2010/8/19
On-Chip Supply Resonance Noise Reduction Method for Multi-IP Cores Utilizing Parasitic Capacitance of Sleep Block
Jinmyoung KIM, Toru NAKURA, Hidehiro TAKATA, Koichiro ISHIBASHI, Makoto IKEDA, Kunihiro ASADA,
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Abstract(in English) This paper proposes an on-chip supply resonance noise reduction method for multi-IP cores utilizing parasitic capacitance of sleep blocks. It has smaller area penalty than conventional on-chip large MOS capacitors because we use parasitic capacitance of sleep blocks for noise cancelling. Measurement results show that the test chip fabricated in a 0.18μm CMOS process achieved 43.3% and 12.5% supply noise reduction on the abrupt supply voltage switching and the abrupt wake-up of a sleep block, respectively. These results make fast power mode transition possible for dynamic voltage scaling and power gating.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Resonant supply noise / Rush current / Parasitic Capacitor / Sleep Block / Signal Integrity
Paper # ICD2010-39,SDM2010-124
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Conference Date 2010/8/19(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On-Chip Supply Resonance Noise Reduction Method for Multi-IP Cores Utilizing Parasitic Capacitance of Sleep Block
Sub Title (in English)
Keyword(1) Resonant supply noise
Keyword(2) Rush current
Keyword(3) Parasitic Capacitor
Keyword(4) Sleep Block
Keyword(5) Signal Integrity
1st Author's Name Jinmyoung KIM
1st Author's Affiliation Dept. of Electrical Engineering, the University of Tokyo()
2nd Author's Name Toru NAKURA
2nd Author's Affiliation VLSI Design and Education Center, the University of Tokyo
3rd Author's Name Hidehiro TAKATA
3rd Author's Affiliation Design Platform Development Division, Renesas Electronics Corporation
4th Author's Name Koichiro ISHIBASHI
4th Author's Affiliation Design Platform Development Division, Renesas Electronics Corporation
5th Author's Name Makoto IKEDA
5th Author's Affiliation Dept. of Electrical Engineering, the University of Tokyo:VLSI Design and Education Center, the University of Tokyo
6th Author's Name Kunihiro ASADA
6th Author's Affiliation Dept. of Electrical Engineering, the University of Tokyo:VLSI Design and Education Center, the University of Tokyo
Date 2010/8/19
Paper # ICD2010-39,SDM2010-124
Volume (vol) vol.110
Number (no) 183
Page pp.pp.-
#Pages 4
Date of Issue