Presentation | 2010-07-22 Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring Yuuki ARAGA, Takushi HASHIDA, Makoto NAGATA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Multi-channel waveform monitoring system for large-scale SoCs. The system consists of probing front end circuits and a waveform acquisition kernel. In this paper, we constructed an on-chip waveform capturing system. We evaluated throughput of digitization and linearity of monitor system, which are the most important performance measures. Waveform acquisition at the system throughput of 1.24 s/point is achieved by proposed algorithm, demonstrates 60.4dB SFDR, 52.4dB SNDR and 8.4 ENOB at 1 Gs/s for 500-MHz bandwidth, and demonstrates measurement of chip temperature by combination of thermal sensor and PFE. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Mixed signal LSI / On-chip testing |
Paper # | ICD2010-22 |
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Committee | ICD |
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Conference Date | 2010/7/15(1days) |
Place (in Japanese) | (See Japanese page) |
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Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring |
Sub Title (in English) | |
Keyword(1) | Mixed signal LSI |
Keyword(2) | On-chip testing |
1st Author's Name | Yuuki ARAGA |
1st Author's Affiliation | Graduate school of system informatics, Kobe University() |
2nd Author's Name | Takushi HASHIDA |
2nd Author's Affiliation | Graduate school of system informatics, Kobe University |
3rd Author's Name | Makoto NAGATA |
3rd Author's Affiliation | Graduate school of system informatics, Kobe University |
Date | 2010-07-22 |
Paper # | ICD2010-22 |
Volume (vol) | vol.110 |
Number (no) | 140 |
Page | pp.pp.- |
#Pages | 5 |
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