Presentation 2010-07-22
Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring
Yuuki ARAGA, Takushi HASHIDA, Makoto NAGATA,
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Abstract(in English) Multi-channel waveform monitoring system for large-scale SoCs. The system consists of probing front end circuits and a waveform acquisition kernel. In this paper, we constructed an on-chip waveform capturing system. We evaluated throughput of digitization and linearity of monitor system, which are the most important performance measures. Waveform acquisition at the system throughput of 1.24 s/point is achieved by proposed algorithm, demonstrates 60.4dB SFDR, 52.4dB SNDR and 8.4 ENOB at 1 Gs/s for 500-MHz bandwidth, and demonstrates measurement of chip temperature by combination of thermal sensor and PFE.
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Keyword(in English) Mixed signal LSI / On-chip testing
Paper # ICD2010-22
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Committee ICD
Conference Date 2010/7/15(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Evaluation of algorithms for waveform acquisition in on-chip multi-channel monitoring
Sub Title (in English)
Keyword(1) Mixed signal LSI
Keyword(2) On-chip testing
1st Author's Name Yuuki ARAGA
1st Author's Affiliation Graduate school of system informatics, Kobe University()
2nd Author's Name Takushi HASHIDA
2nd Author's Affiliation Graduate school of system informatics, Kobe University
3rd Author's Name Makoto NAGATA
3rd Author's Affiliation Graduate school of system informatics, Kobe University
Date 2010-07-22
Paper # ICD2010-22
Volume (vol) vol.110
Number (no) 140
Page pp.pp.-
#Pages 5
Date of Issue