| Presentation | 2010-07-22 An Integrated Cryogenic Current Comparator Michitaka MARUYAMA, Chiharu URANO, Takehiko OE, Masaaki MAEZAWA, Takahiro YAMADA, Mutsuo HIDAKA, Tetsuro SATOH, Shuichi NAGASAWA, Kenji HINODE, Nobu-hisa KANEKO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We propose a small cryogenic current comparator (CCC) using a superconducting integrated circult technology. Conventional CCCs, which are widely used for high-precision electrical measurements, are usually made with lead bulk, and have the sizes of the order of several to more than ten centimeters. Such the hand-made CCCs require a special skill for their fabrication and liquid helium cooling for their operation. Additionally, they have some problems in durability and reliability due to mechanically soft lead material. In actual measurements, data is easily affected by vibration. The three dimensional structure of CCC is rather complex; it was not realized by normal superconductor thin-film processes. If we could make a CCC with a thin-film structure using a multilayer process which was originally developed for fabricating superconducting integrated circuits, a small-size integrated CCC (ICCC), which can be cooled with a compact cryocooler, with high reliability and increased functions will be realized. This paper proposes the basis, the design and fabrication of the ICCC, shows some experimental results, and discusses prospective views. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Superconductor / Cryogenic Current Comparator / Multilayer Process / Precision Measurement |
| Paper # | SCE2010-16 |
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| Conference Information | |
| Committee | SCE |
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| Conference Date | 2010/7/15(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Superconductive Electronics (SCE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Integrated Cryogenic Current Comparator |
| Sub Title (in English) | |
| Keyword(1) | Superconductor |
| Keyword(2) | Cryogenic Current Comparator |
| Keyword(3) | Multilayer Process |
| Keyword(4) | Precision Measurement |
| 1st Author's Name | Michitaka MARUYAMA |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST)() |
| 2nd Author's Name | Chiharu URANO |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 3rd Author's Name | Takehiko OE |
| 3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name | Masaaki MAEZAWA |
| 4th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 5th Author's Name | Takahiro YAMADA |
| 5th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 6th Author's Name | Mutsuo HIDAKA |
| 6th Author's Affiliation | International Superconductivity Technology Center (ISTEC) |
| 7th Author's Name | Tetsuro SATOH |
| 7th Author's Affiliation | International Superconductivity Technology Center (ISTEC) |
| 8th Author's Name | Shuichi NAGASAWA |
| 8th Author's Affiliation | International Superconductivity Technology Center (ISTEC) |
| 9th Author's Name | Kenji HINODE |
| 9th Author's Affiliation | International Superconductivity Technology Center (ISTEC) |
| 10th Author's Name | Nobu-hisa KANEKO |
| 10th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| Date | 2010-07-22 |
| Paper # | SCE2010-16 |
| Volume (vol) | vol.110 |
| Number (no) | 139 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |