Presentation 2010-08-26
Reliability Improvement of Error-free Optical Line Switching Technique
Kuniaki TANAKA, Koichi YOSHIDA, Kazutaka NOTO, Tetsuya MANABE, Yuji AZUMA,
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Abstract(in English) The method of switching the transmission line without interrupting service while temporarily dualing communication lines decreases the transmission quality due to causing the beat interference between carrier waves and the intersymbol interference between signals. We demonstrate with the calculation and the experiment that the wavelength conversion technology (XGM) is effective for the decrease of the beat interference. Then, the allowable optical path length difference without the intersymbol interference is estimated from the experiment. The error-free optical line switching technique with high reliability was able to be achieved by these solutions.
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Keyword(in English) Dualized line / Error-free optical line switching / Wavelength conversion / Beat Interference / SOA / XGM
Paper # OFT2010-18
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Committee OFT
Conference Date 2010/8/19(1days)
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Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reliability Improvement of Error-free Optical Line Switching Technique
Sub Title (in English)
Keyword(1) Dualized line
Keyword(2) Error-free optical line switching
Keyword(3) Wavelength conversion
Keyword(4) Beat Interference
Keyword(5) SOA
Keyword(6) XGM
1st Author's Name Kuniaki TANAKA
1st Author's Affiliation NTT Access Networks Service Systems Laboratories, NTT Corporation()
2nd Author's Name Koichi YOSHIDA
2nd Author's Affiliation NTT Access Networks Service Systems Laboratories, NTT Corporation
3rd Author's Name Kazutaka NOTO
3rd Author's Affiliation NTT Access Networks Service Systems Laboratories, NTT Corporation
4th Author's Name Tetsuya MANABE
4th Author's Affiliation NTT Access Networks Service Systems Laboratories, NTT Corporation
5th Author's Name Yuji AZUMA
5th Author's Affiliation NTT Access Networks Service Systems Laboratories, NTT Corporation
Date 2010-08-26
Paper # OFT2010-18
Volume (vol) vol.110
Number (no) 177
Page pp.pp.-
#Pages 6
Date of Issue