| Presentation | 2009-12-11 Analysis of Stable Behavior in InAs/InP MQW DFB laser Using an OBIC Monitor Tatsuya TAKESHITA, Tomonari SATO, Manabu MITSUHARA, Yasuhiro KONDO, Hiromi OOHASHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We have realized reliable 2.3 μm wavelength InAs/InP MQW DFB lasers for trace gas monitoring applications. The estimated median lifetime exceeds 1 x 10^5 hours during aging at an ambient temperature of 45℃ and with a constant output power of 3 mW. It is clarified that the main degradation mechanism in DFB lasers with highly strained InAs quantum wells is dominated by a diffusion process as found with conventional telecommunication lasers. Furthermore, stable behavior devices with deviation from the conventional t^<0.5> deterioration are analyzed by using the optical beam induced current (OBIC) technique. We found that a decrease in the carrier concentration of the p-type InP buried layer caused by aging leads to a decrease in the pass current and an increase in the operating current is suppressed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | semiconductor lasers / quantum well lasers / failure analysis / reliability / aging |
| Paper # | LQE2009-143 |
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| Conference Information | |
| Committee | LQE |
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| Conference Date | 2009/12/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
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| Assistant | |
| Paper Information | |
| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis of Stable Behavior in InAs/InP MQW DFB laser Using an OBIC Monitor |
| Sub Title (in English) | |
| Keyword(1) | semiconductor lasers |
| Keyword(2) | quantum well lasers |
| Keyword(3) | failure analysis |
| Keyword(4) | reliability |
| Keyword(5) | aging |
| 1st Author's Name | Tatsuya TAKESHITA |
| 1st Author's Affiliation | NTT Photonics Laboratories, NTT Corporation() |
| 2nd Author's Name | Tomonari SATO |
| 2nd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 3rd Author's Name | Manabu MITSUHARA |
| 3rd Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 4th Author's Name | Yasuhiro KONDO |
| 4th Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| 5th Author's Name | Hiromi OOHASHI |
| 5th Author's Affiliation | NTT Photonics Laboratories, NTT Corporation |
| Date | 2009-12-11 |
| Paper # | LQE2009-143 |
| Volume (vol) | vol.109 |
| Number (no) | 331 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |