| Presentation | 2009-12-11 Relationship between Facet Stress and Reliability of Edge-Emitting AlGaInAs Laser Diodes Hiroyuki ICHIKAWA, Akiko KUMAGAI, Naoya KONO, Shinji MATSUKAWA, Chie FUKUDA, Keiko IWAI, Nobuyuki IKOMA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Although facet stress is one of the important parameters in edge-emitting laser diodes (LDs), the relationship between facet stress and reliability in AlGaInAs edge-emitting LDs has been unclear. Thus, we prepared two types of LDs which difference is stress-direction at the facet. We carried out three types of reliability tests: forward-biased electrostatic discharge (ESD) tests, long-tern reliability tests, and accelerated aging tests. In ESD tests, cumulative degradation ratio of compressive-stress was 33% lower than that of tensile-stress. This effect was obtained by decrease in optical absorption. In long-term aging tests of 85℃ 8mW 5000h, degradation did not occur. In accelerated aging tests of 85℃ 200mA 800h, degradation occurred only for tensile-stress. This degradation mechanism was different from that due to optical absorption. Although degradation mechanism has been unclear, we found that this degradation is dependent on stress-direction at the facet. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | AlGaInAs / Laser / Stress / Reliability |
| Paper # | LQE2009-142 |
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| Committee | LQE |
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| Conference Date | 2009/12/4(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Lasers and Quantum Electronics (LQE) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Relationship between Facet Stress and Reliability of Edge-Emitting AlGaInAs Laser Diodes |
| Sub Title (in English) | |
| Keyword(1) | AlGaInAs |
| Keyword(2) | Laser |
| Keyword(3) | Stress |
| Keyword(4) | Reliability |
| 1st Author's Name | Hiroyuki ICHIKAWA |
| 1st Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd.:Analysis Technology Reserch Center, Sumitomo Electric Industries, Ltd.() |
| 2nd Author's Name | Akiko KUMAGAI |
| 2nd Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd. |
| 3rd Author's Name | Naoya KONO |
| 3rd Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd. |
| 4th Author's Name | Shinji MATSUKAWA |
| 4th Author's Affiliation | Analysis Technology Reserch Center, Sumitomo Electric Industries, Ltd. |
| 5th Author's Name | Chie FUKUDA |
| 5th Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd. |
| 6th Author's Name | Keiko IWAI |
| 6th Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd. |
| 7th Author's Name | Nobuyuki IKOMA |
| 7th Author's Affiliation | Transmission Devices R&D Laboratory, Sumitomo Electric Industries, Ltd. |
| Date | 2009-12-11 |
| Paper # | LQE2009-142 |
| Volume (vol) | vol.109 |
| Number (no) | 331 |
| Page | pp.pp.- |
| #Pages | 5 |
| Date of Issue | |