Presentation 2009-12-18
Synchronized Operation of a Monolithically-Integrated Si VOA and Ge Photodiode
Sungbong Park, Tai Tsuchizawa, Toshifumi Watanabe, Hiroyuki Shinozima, Hidetaka Nishi, Koji Yamada, Yasuhiko Ishikawa, Kazumi Wada, Seiichi Itabashi,
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Abstract(in English) We have investigated monolithically integrated Ge p-i-n photodiodes and Si variable optical attenuators (VOAs). The Ge photodiode exhibits low dark current of 60 nA and high responsivity of 0.85 A/W at -1 V. Si VOA also shows efficient light attenuation, as the injection current increases. Furthermore, the Ge photodiode shows approximately 1 GHz of 3-dB cut-off frequency while fall and rise time of Si VOAs are few nanoseconds. These dynamic properties ensure synchronized operation between Si VOA and Ge photodiode at 100 MHz. Such a device configuration, consisting of a tapping splitter, a Ge photodiode as a monitoring detector, and a Si VOA is useful for a signal equalization application in burst-mode optical communication.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Si VOA / Ge photodiode / Monolithic integration / Synchronized operation
Paper # OPE2009-169
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Conference Information
Committee OPE
Conference Date 2009/12/11(1days)
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Registration To Optoelectronics (OPE)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Synchronized Operation of a Monolithically-Integrated Si VOA and Ge Photodiode
Sub Title (in English)
Keyword(1) Si VOA
Keyword(2) Ge photodiode
Keyword(3) Monolithic integration
Keyword(4) Synchronized operation
1st Author's Name Sungbong Park
1st Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.()
2nd Author's Name Tai Tsuchizawa
2nd Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
3rd Author's Name Toshifumi Watanabe
3rd Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
4th Author's Name Hiroyuki Shinozima
4th Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
5th Author's Name Hidetaka Nishi
5th Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
6th Author's Name Koji Yamada
6th Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
7th Author's Name Yasuhiko Ishikawa
7th Author's Affiliation Department of Materials Engineering, The University of Tokyo
8th Author's Name Kazumi Wada
8th Author's Affiliation Department of Materials Engineering, The University of Tokyo
9th Author's Name Seiichi Itabashi
9th Author's Affiliation NTT Microsystem Integration Laboratories, NTT Corp.
Date 2009-12-18
Paper # OPE2009-169
Volume (vol) vol.109
Number (no) 353
Page pp.pp.-
#Pages 6
Date of Issue