Presentation 2010-05-21
The Suggestion of Corrected Non-overlapping Template Matching Test
Yuichi TAKEDA, Mituaki HUZII, Toshinari KAMAKURA, Norio WATANABE, Takakazu SUGIYAMA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Rukhin et al. (2000) proposed the non-overlapping template matching test as one of methods for statistical testing of randomness for cryptographic. But any methods for choosing the template have not been shown. We propose a modified version of this test including the choice of the template.
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Keyword(in English) Cryptograph / Testing randomness / SP-800-22 / Non-over Lapping Template Matching Test
Paper # ISEC2010-1
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Committee ISEC
Conference Date 2010/5/14(1days)
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Registration To Information Security (ISEC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) The Suggestion of Corrected Non-overlapping Template Matching Test
Sub Title (in English)
Keyword(1) Cryptograph
Keyword(2) Testing randomness
Keyword(3) SP-800-22
Keyword(4) Non-over Lapping Template Matching Test
1st Author's Name Yuichi TAKEDA
1st Author's Affiliation Kanagawa Institute of Technology()
2nd Author's Name Mituaki HUZII
2nd Author's Affiliation Faculty of Science and Engineering, Chuo University
3rd Author's Name Toshinari KAMAKURA
3rd Author's Affiliation Faculty of Science and Engineering, Chuo University
4th Author's Name Norio WATANABE
4th Author's Affiliation Faculty of Science and Engineering, Chuo University
5th Author's Name Takakazu SUGIYAMA
5th Author's Affiliation Faculty of Science and Engineering, Chuo University
Date 2010-05-21
Paper # ISEC2010-1
Volume (vol) vol.110
Number (no) 44
Page pp.pp.-
#Pages 4
Date of Issue