Presentation 2010-01-28
Characterization of Nonradiative Recombination Centers in InGaN Quantum Wells by Two-Wavelength Excited Photoluminescence
Tomohiko YAMAGUCHI, Kouhewi IGARASHI, Takeshi FUKUDA, Zentaro HONDA, Norihiko KAMATA,
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Abstract(in English) We investigated below-gap levels in MOCVD-grown Si-doped In_<0.16>Ga_<0.84>N/In_<0.02>Ga_<0.98>N Quantum well (QW) structures by an optical method of Two-wavelength Excited Photoluminescence, as the non-destructive, non-contacting spectroscopy without electrode. Though the dependence of intensity and energy (1.27~1.95eV) of the below-gap excitation on the photoluminescence intensity change, we found that Si-doping in both barrier and well layers reduced the density of below-gap states in the QW region.
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Keyword(in English) InGaN / Si-doping / Quantum well structure / Non-radiative recombination center / Two-wavelength excited photoluminescence
Paper # EID2009-55
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Committee EID
Conference Date 2010/1/21(1days)
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Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Characterization of Nonradiative Recombination Centers in InGaN Quantum Wells by Two-Wavelength Excited Photoluminescence
Sub Title (in English)
Keyword(1) InGaN
Keyword(2) Si-doping
Keyword(3) Quantum well structure
Keyword(4) Non-radiative recombination center
Keyword(5) Two-wavelength excited photoluminescence
1st Author's Name Tomohiko YAMAGUCHI
1st Author's Affiliation Graduate School of Science and Engineering, Saitama University()
2nd Author's Name Kouhewi IGARASHI
2nd Author's Affiliation Graduate School of Science and Engineering, Saitama University
3rd Author's Name Takeshi FUKUDA
3rd Author's Affiliation Graduate School of Science and Engineering, Saitama University
4th Author's Name Zentaro HONDA
4th Author's Affiliation Graduate School of Science and Engineering, Saitama University
5th Author's Name Norihiko KAMATA
5th Author's Affiliation Graduate School of Science and Engineering, Saitama University
Date 2010-01-28
Paper # EID2009-55
Volume (vol) vol.109
Number (no) 404
Page pp.pp.-
#Pages 4
Date of Issue