| Presentation | 2009-12-03 Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity Isao BEPPU, Kohei MIYASE, Yuta YAMATO, Xiaoqing WEN, Seiji KAJIHARA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Increase of power dissipation and IR-drop during scan-shifting operation and/or capture operation is still challenging problem for LSI testing. It is known that power dissipation during scan-shifting can be reduced with DFT techniques. As for capture power reduction, post-ATPG test modification is the preferable solution since it does not cause circuit modification, test data inflation and post-ATPG modification consists of X-identification and X-filling. Although the existing X-identification identifies a plenty number of X-bits, some test cubes have a relatively small number of X-bits. Usually a desirable number of X-bits for each test cube must be different depending on X-filling and its purposes. In this paper we propose a new X-identification to control the X-bit distribution according to a given required distribution. Experimental results demonstrate the proposed method to optimize the percentage of X-bits to reduce switching activity. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | ATPG / X-bit / X-identification / X-filling / post-ATPG test modification |
| Paper # | VLD2009-55,DC2009-42 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2009/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity |
| Sub Title (in English) | |
| Keyword(1) | ATPG |
| Keyword(2) | X-bit |
| Keyword(3) | X-identification |
| Keyword(4) | X-filling |
| Keyword(5) | post-ATPG test modification |
| 1st Author's Name | Isao BEPPU |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Kohei MIYASE |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 3rd Author's Name | Yuta YAMATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology |
| 4th Author's Name | Xiaoqing WEN |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 5th Author's Name | Seiji KAJIHARA |
| 5th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| Date | 2009-12-03 |
| Paper # | VLD2009-55,DC2009-42 |
| Volume (vol) | vol.109 |
| Number (no) | 315 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |