| Presentation | 2009-12-03 Detection of Fault Candidate portions by DEF data Visualization Kazuaki KISHI, Masaru SANADA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Line information visualized using DEF data, and layout data of unique fault formations makes it possible to indicate fault formations and to detect the intended line names. The former formations are applied to discern the physical analysis positions for real fault LSI. The latter names are used to pull out the gate circuit positions connect to net names among cell circuit. The above data combined with connection information of transistor level has been led to an easy fault diagnosis technology based on voltage value. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LSI / DEF / fault diagnosis / fault candidate / visualization / net name |
| Paper # | VLD2009-53,DC2009-40 |
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| Conference Information | |
| Committee | VLD |
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| Conference Date | 2009/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | VLSI Design Technologies (VLD) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Detection of Fault Candidate portions by DEF data Visualization |
| Sub Title (in English) | |
| Keyword(1) | LSI |
| Keyword(2) | DEF |
| Keyword(3) | fault diagnosis |
| Keyword(4) | fault candidate |
| Keyword(5) | visualization |
| Keyword(6) | net name |
| 1st Author's Name | Kazuaki KISHI |
| 1st Author's Affiliation | Kochi University of Technology() |
| 2nd Author's Name | Masaru SANADA |
| 2nd Author's Affiliation | Kochi University of Technology |
| Date | 2009-12-03 |
| Paper # | VLD2009-53,DC2009-40 |
| Volume (vol) | vol.109 |
| Number (no) | 315 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |