Presentation 2009-12-03
An Approach to Dependable Chip Multiprocessors with Process Pair and Swap Mechanism
Tomohide NAGAI, Masashi IMAI, Takashi NANYA,
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Abstract(in English) With the down scale of technology and the increase of transistor count, future processors are expected to be more susceptible to faults. In this paper, we propose a processor-level fault tolerance technique for chip multi-processors called "Pair & Swap" (P&S). We also propose a new metric called "Mean Computation To Failure" (MCTF) considering not only reliability but also performance. We evaluate the P&S and the traditional triple modular redundancy (TMR) by MCTF. The result shows that the MCTF of the P&S is about 1.5 times larger than that of the dynamic TMR.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Pair & Swap / graceful degradation / dependable chip multiprocessor / mean computation to failure
Paper # VLD2009-51,DC2009-38
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Committee VLD
Conference Date 2009/11/25(1days)
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Registration To VLSI Design Technologies (VLD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An Approach to Dependable Chip Multiprocessors with Process Pair and Swap Mechanism
Sub Title (in English)
Keyword(1) Pair & Swap
Keyword(2) graceful degradation
Keyword(3) dependable chip multiprocessor
Keyword(4) mean computation to failure
1st Author's Name Tomohide NAGAI
1st Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo()
2nd Author's Name Masashi IMAI
2nd Author's Affiliation Komaba Open Laboratory, The University of Tokyo
3rd Author's Name Takashi NANYA
3rd Author's Affiliation Graduate School of Information Science and Technology, The University of Tokyo
Date 2009-12-03
Paper # VLD2009-51,DC2009-38
Volume (vol) vol.109
Number (no) 315
Page pp.pp.-
#Pages 6
Date of Issue