Presentation 2010-04-23
Ferroelectric (Fe)-NAND Flash Memory with Non-volatile Page Buffer for Data Center Application Enterprise Solid-State Drives (SSD)
Teruyoshi HATANAKA, Ryoji YAJIMA, Takeshi HORIUCHI, Shouyu Wang, Xizhen Zhang, Mitsue TAKAHASHI, Shigeki SAKAI, Ken TAKEUCHI,
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Abstract(in English) A ferroelectric (Fe)-NAND flash memory with a non-volatile (NV) page buffer is proposed. The data fragmentation in a random write is removed by introducing a batch write algorithm. As a result, the SSD performance can double. The NV-page buffer realizes a power outage immune highly reliable operation. With a low program/erase voltage, 6V and a high endurance, 100million cycles, the proposed Fe-NAND is most suitable for a highly reliable high-speed low power data center application enterprise SSD.
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Keyword(in English) SSD / NAND / Flash / Ferroelectric
Paper # ICD2010-11
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Committee ICD
Conference Date 2010/4/15(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Ferroelectric (Fe)-NAND Flash Memory with Non-volatile Page Buffer for Data Center Application Enterprise Solid-State Drives (SSD)
Sub Title (in English)
Keyword(1) SSD
Keyword(2) NAND
Keyword(3) Flash
Keyword(4) Ferroelectric
1st Author's Name Teruyoshi HATANAKA
1st Author's Affiliation Graduate School of Engineering, The University of Tokyo()
2nd Author's Name Ryoji YAJIMA
2nd Author's Affiliation Graduate School of Engineering, The University of Tokyo
3rd Author's Name Takeshi HORIUCHI
3rd Author's Affiliation Novel Electron Devices Group, Nanoelectronics Research Institute National Institute of Advanced Industrial Science and Technology
4th Author's Name Shouyu Wang
4th Author's Affiliation Novel Electron Devices Group, Nanoelectronics Research Institute National Institute of Advanced Industrial Science and Technology
5th Author's Name Xizhen Zhang
5th Author's Affiliation Novel Electron Devices Group, Nanoelectronics Research Institute National Institute of Advanced Industrial Science and Technology
6th Author's Name Mitsue TAKAHASHI
6th Author's Affiliation Novel Electron Devices Group, Nanoelectronics Research Institute National Institute of Advanced Industrial Science and Technology
7th Author's Name Shigeki SAKAI
7th Author's Affiliation Novel Electron Devices Group, Nanoelectronics Research Institute National Institute of Advanced Industrial Science and Technology
8th Author's Name Ken TAKEUCHI
8th Author's Affiliation Graduate School of Engineering, The University of Tokyo
Date 2010-04-23
Paper # ICD2010-11
Volume (vol) vol.110
Number (no) 9
Page pp.pp.-
#Pages 6
Date of Issue