Presentation 2009-12-14
Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit
NAOYA Azuma, Makoto NAGATA,
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Abstract(in English) Susceptibility of radio frequency (RF) circuits against environmental noises was evaluated by way of direct power injection. Measurements performed on a 90-nm 2.45 GHz CMOS RF driver amplifier show that the injection of RF power into on-die p^+ guard bands creates tones at the primary and up-converted frequencies. Simulation achieves the error of less than 2dB against the measured susceptibility of -40dB, with the models of passive impedance networks covering probing tips, die pads, metal wirings, as well as a silicon substrate.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Substrate noise / Substrate coupling / Amplifier / RF
Paper # ICD2009-83
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Committee ICD
Conference Date 2009/12/7(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit
Sub Title (in English)
Keyword(1) Substrate noise
Keyword(2) Substrate coupling
Keyword(3) Amplifier
Keyword(4) RF
1st Author's Name NAOYA Azuma
1st Author's Affiliation Kobe University()
2nd Author's Name Makoto NAGATA
2nd Author's Affiliation Kobe University
Date 2009-12-14
Paper # ICD2009-83
Volume (vol) vol.109
Number (no) 336
Page pp.pp.-
#Pages 4
Date of Issue