Presentation | 2009-12-14 Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit NAOYA Azuma, Makoto NAGATA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Susceptibility of radio frequency (RF) circuits against environmental noises was evaluated by way of direct power injection. Measurements performed on a 90-nm 2.45 GHz CMOS RF driver amplifier show that the injection of RF power into on-die p^+ guard bands creates tones at the primary and up-converted frequencies. Simulation achieves the error of less than 2dB against the measured susceptibility of -40dB, with the models of passive impedance networks covering probing tips, die pads, metal wirings, as well as a silicon substrate. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Substrate noise / Substrate coupling / Amplifier / RF |
Paper # | ICD2009-83 |
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Committee | ICD |
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Conference Date | 2009/12/7(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Integrated Circuits and Devices (ICD) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Measurement and Simulation of Substrate Coupling of CMOS-RF Circuit |
Sub Title (in English) | |
Keyword(1) | Substrate noise |
Keyword(2) | Substrate coupling |
Keyword(3) | Amplifier |
Keyword(4) | RF |
1st Author's Name | NAOYA Azuma |
1st Author's Affiliation | Kobe University() |
2nd Author's Name | Makoto NAGATA |
2nd Author's Affiliation | Kobe University |
Date | 2009-12-14 |
Paper # | ICD2009-83 |
Volume (vol) | vol.109 |
Number (no) | 336 |
Page | pp.pp.- |
#Pages | 4 |
Date of Issue |