| Presentation | 2009-12-14 Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure Mitsuya FUKAZAWA, Makoto NAGATA, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Logical operations in CMOS digital integration are highly prone to fail as the amount of power supply (PS) drop approaches to failure threshold. PS voltage variation is characterized by built-in noise monitors in a 32-bit microprocessor of 90-nm CMOS technology, and related with operation failures by instruction-level programming for logical failure analysis. Combination of voltage drop size and activated logic path determines failure sensitivity and class of failures. Experimental observation as well as simplified simulation is applied for the detailed understanding of the impact of PS noise on logical operations of digital integrated circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | dynamic power supply noise / built-in probing circuit / logical operation failure / dynamic frequency scaling |
| Paper # | ICD2009-77 |
| Date of Issue |
| Conference Information | |
| Committee | ICD |
|---|---|
| Conference Date | 2009/12/7(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Integrated Circuits and Devices (ICD) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Experimental Evaluation Technique for Power Supply Noise and Logical Operation Failure |
| Sub Title (in English) | |
| Keyword(1) | dynamic power supply noise |
| Keyword(2) | built-in probing circuit |
| Keyword(3) | logical operation failure |
| Keyword(4) | dynamic frequency scaling |
| 1st Author's Name | Mitsuya FUKAZAWA |
| 1st Author's Affiliation | Renesas Technology Corporation() |
| 2nd Author's Name | Makoto NAGATA |
| 2nd Author's Affiliation | Dept. of Computer Science and Systems Engineering, Kobe University |
| Date | 2009-12-14 |
| Paper # | ICD2009-77 |
| Volume (vol) | vol.109 |
| Number (no) | 336 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |