Presentation 2009-12-14
Image Sensor : An absorbing device with the hardest design
Satoshi AOYAMA, Jong-Ho PARK, Takashi WATANABE, Shoji KAWAHITO,
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Abstract(in English) Many kinds of image sensors are used in various fields as for the key device of the image input, as well as other information inputs. The speaker introduces the feature of the sensors which have been studied at Shizuoka University and developed at Brookman Technology Inc., respectively. It also describes the design guide and issues for these devices.
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Keyword(in English) Image Sensor / CMOS / AD Converter / dark current / low noise / Magnetic Probe
Paper # ICD2009-76
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Committee ICD
Conference Date 2009/12/7(1days)
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Registration To Integrated Circuits and Devices (ICD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Image Sensor : An absorbing device with the hardest design
Sub Title (in English)
Keyword(1) Image Sensor
Keyword(2) CMOS
Keyword(3) AD Converter
Keyword(4) dark current
Keyword(5) low noise
Keyword(6) Magnetic Probe
1st Author's Name Satoshi AOYAMA
1st Author's Affiliation Brookman Technology, Inc.()
2nd Author's Name Jong-Ho PARK
2nd Author's Affiliation Brookman Technology, Inc.
3rd Author's Name Takashi WATANABE
3rd Author's Affiliation Brookman Technology, Inc.
4th Author's Name Shoji KAWAHITO
4th Author's Affiliation Brookman Technology, Inc.:Research Institute of Electronics, Shizuoka University
Date 2009-12-14
Paper # ICD2009-76
Volume (vol) vol.109
Number (no) 336
Page pp.pp.-
#Pages 5
Date of Issue