Presentation 2010-05-13
Single Photon Detection in Single Dot and Multi Dots Channel Phosphorus-Doped SOI-FET
Arief UDHIARTO, Daniel MORARU, Ryusuke NAKAMURA, Sakito MIKI, Takeshi MIZUNO, Michiharu TABE,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) We report the single photon detection using single dopant atom in single dot and multi dot channel phosphorus-doped silicon on insulator-field effect transistor (SOI-FET). The single photon is detected as current jumps. The current jumps are proportional to the number of incident photons. We also observe that current jumps depend on the number of dopants in channel indicating trapping of individual photo-generated electrons occurs in the single dopant.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Single photon / single dopant / single electron / SOI-FET
Paper # ED2010-22,CPM2010-12,SDM2010-22
Date of Issue

Conference Information
Committee SDM
Conference Date 2010/5/6(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Silicon Device and Materials (SDM)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Single Photon Detection in Single Dot and Multi Dots Channel Phosphorus-Doped SOI-FET
Sub Title (in English)
Keyword(1) Single photon
Keyword(2) single dopant
Keyword(3) single electron
Keyword(4) SOI-FET
1st Author's Name Arief UDHIARTO
1st Author's Affiliation Research Institute of Electronics, Shizuoka University()
2nd Author's Name Daniel MORARU
2nd Author's Affiliation Research Institute of Electronics, Shizuoka University
3rd Author's Name Ryusuke NAKAMURA
3rd Author's Affiliation Research Institute of Electronics, Shizuoka University
4th Author's Name Sakito MIKI
4th Author's Affiliation Research Institute of Electronics, Shizuoka University
5th Author's Name Takeshi MIZUNO
5th Author's Affiliation Research Institute of Electronics, Shizuoka University
6th Author's Name Michiharu TABE
6th Author's Affiliation Research Institute of Electronics, Shizuoka University
Date 2010-05-13
Paper # ED2010-22,CPM2010-12,SDM2010-22
Volume (vol) vol.110
Number (no) 31
Page pp.pp.-
#Pages 5
Date of Issue