Presentation 2010-01-21
Study on the influence of the premises cable between VTU-O and VTU-R on the immunity of VDSL systems
Kentaro MOKUSHI, Yuichiro OKUGAWA, Masakatsu OGAWA, Kazuhiro TAKAYA, Kazuo MURAKAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) VDSL service has been progressed because it achieves high-speed access network with copper premises cables. Although inexpensive FTTH service has been offered by VDSL systems, the link between a VDSL transceiver unit at the optical network unit and a VDSL transceiver unit at the remote site is influenced by electromagnetic disturbance induced into premises cables. The influence of different configurations and different types of premises cables on the longitudinal conversion loss (LCL) or the immunity of VDSL systems has also been investigated. However, although the influence has been investigated by using the measurement systems on the ground plane, the premises cables are not laid out on the ground plane or near by materials of metal in an actual installation. In this paper, we have investigated the influence of the distance between the premises cable and the ground plane on the LCL of the cable or the immunity level of the VDSL system. As a result, the LCL of the cable has been varied depends on the distance, and the immunity level has been correlated with the LCL.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) VDSL / premises cable / ground plane / immunity / LCL
Paper # EMCJ2009-102
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Conference Information
Committee EMCJ
Conference Date 2010/1/14(1days)
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Paper Information
Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on the influence of the premises cable between VTU-O and VTU-R on the immunity of VDSL systems
Sub Title (in English)
Keyword(1) VDSL
Keyword(2) premises cable
Keyword(3) ground plane
Keyword(4) immunity
Keyword(5) LCL
1st Author's Name Kentaro MOKUSHI
1st Author's Affiliation Technical Assistance and Support Center, NTT East Corporation()
2nd Author's Name Yuichiro OKUGAWA
2nd Author's Affiliation Technical Assistance and Support Center, NTT East Corporation
3rd Author's Name Masakatsu OGAWA
3rd Author's Affiliation Technical Assistance and Support Center, NTT East Corporation
4th Author's Name Kazuhiro TAKAYA
4th Author's Affiliation Technical Assistance and Support Center, NTT East Corporation
5th Author's Name Kazuo MURAKAWA
5th Author's Affiliation Technical Assistance and Support Center, NTT East Corporation
Date 2010-01-21
Paper # EMCJ2009-102
Volume (vol) vol.109
Number (no) 370
Page pp.pp.-
#Pages 6
Date of Issue