Presentation 2009-12-18
Study on Radiated Electromagnetic Field Intensity due to Micro Gap Discharge as the low voltage BSD
Ken KAWAMATA, Shigeki MINEGISHI, Osamu Fujiwara,
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Abstract(in English) The breakdown field strength and radiated electromagnetic field intensity due to micro gap discharge were examined in experimental study. As a consequence, the radiated electromagnetic field intensity has inverse proportion to discharge voltage below about 800V breakdown. The relationship between radiated electromagnetic field intensity and discharge voltage has indefinite dispersion in the wide gap discharge of about over 0.04mm gap length. It was confirmed that one of cause of the dispersion is an effect of surface condition in the discharge electrode. And so, we confirmed that the TEM half horn antenna is able to measure the very wideband transition duration about 12 GHz in time domain.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Breakdown field strength / Radiated electromagnetic field intensity / ESD / Micro gap discharge / TEM half horn antenna
Paper # EMCJ2009-95
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Committee EMCJ
Conference Date 2009/12/11(1days)
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Registration To Electromagnetic Compatibility (EMCJ)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on Radiated Electromagnetic Field Intensity due to Micro Gap Discharge as the low voltage BSD
Sub Title (in English)
Keyword(1) Breakdown field strength
Keyword(2) Radiated electromagnetic field intensity
Keyword(3) ESD
Keyword(4) Micro gap discharge
Keyword(5) TEM half horn antenna
1st Author's Name Ken KAWAMATA
1st Author's Affiliation Graduate school of Engineering, Hachinohe Inst. of Tech.()
2nd Author's Name Shigeki MINEGISHI
2nd Author's Affiliation Graduate school of Engineering, Tohoku Gakuin University
3rd Author's Name Osamu Fujiwara
3rd Author's Affiliation Graduate school of Engineering, Nagoya Inst. of Tech.
Date 2009-12-18
Paper # EMCJ2009-95
Volume (vol) vol.109
Number (no) 350
Page pp.pp.-
#Pages 6
Date of Issue