Presentation 2010-04-22
Degradation of charge transport materials induced by photo-excitation and minority carriers
Ken-ichi NAKAYAMA, Keiji NOINE, Yong-Jin PU, Hisahiro SASABE, Junji KIDO,
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Abstract(in English) Photo excitation and minority carriers were revealed to be important causes of degradation in organic light-emitting diode. Degradation process in hole transporting material was investigated by J-V characteristics measurement in the hole-only device and hole mobility measured by dark injection method.
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Keyword(in English) organic light-emitting diode / degradation / carrier transport material / minority carrier
Paper # ED2010-2
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Committee ED
Conference Date 2010/4/15(1days)
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Registration To Electron Devices (ED)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation of charge transport materials induced by photo-excitation and minority carriers
Sub Title (in English)
Keyword(1) organic light-emitting diode
Keyword(2) degradation
Keyword(3) carrier transport material
Keyword(4) minority carrier
1st Author's Name Ken-ichi NAKAYAMA
1st Author's Affiliation Department of Organic Device Engineering, Yamagata University()
2nd Author's Name Keiji NOINE
2nd Author's Affiliation Department of Organic Device Engineering, Yamagata University
3rd Author's Name Yong-Jin PU
3rd Author's Affiliation Department of Organic Device Engineering, Yamagata University
4th Author's Name Hisahiro SASABE
4th Author's Affiliation Department of Organic Device Engineering, Yamagata University
5th Author's Name Junji KIDO
5th Author's Affiliation Department of Organic Device Engineering, Yamagata University
Date 2010-04-22
Paper # ED2010-2
Volume (vol) vol.110
Number (no) 11
Page pp.pp.-
#Pages 2
Date of Issue