Presentation 2010-01-20
Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode
Tadakiyo SEKI, Hiroyuki SHIBATA, Hiroki TAKESUE, Yasuhiro TOKURA, Nobuyuki IMOTO,
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Abstract(in English) We report the pulse-to-pulse timing jitter measurement of a niobium nitride (NbN) superconducting single-photon detector (SSPD) which we fabricated and and InGaAs avalanche photodiode (APD) at 1550-nm wavelength. A direct comparison of their timing jitter was performed by using the same experimental configuration to measure both detectors. The measured jitter of the SSPD and the APD are 75 and 84 ps at full-width at half-maximum (FWHM), and 138 and 384 ps at full-width at tenth-maximum (FWTM), respectively. The jitter of the SSPD remains small at FWTM while that of APD is large. We also estimated the transmission distances and secure key generation rates for fiber-based quantum key distribution (QKD) when these detectors are used. The estimated transmission distances of the APD are 86 km and 107 km with respect to 1 ns and 100 ps time windows, respectively, and those of the SSPD are 125 km and 172 km with respect to 1 ns and 100 Ps time windows, respectively. This estimation indicates the SSPD's advantages over QKD compared to the APD.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Superconducting nanowire / Single photon detection / Timing Jitter / Quantum key distribution
Paper # SCE2009-26
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Committee SCE
Conference Date 2010/1/13(1days)
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Registration To Superconductive Electronics (SCE)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Comparison of timing jitter between NbN superconducting single-photon detector and avalanche photodiode
Sub Title (in English)
Keyword(1) Superconducting nanowire
Keyword(2) Single photon detection
Keyword(3) Timing Jitter
Keyword(4) Quantum key distribution
1st Author's Name Tadakiyo SEKI
1st Author's Affiliation NTT Basic Research Laboratories, NTT Corporation:Graduate School of Engineering Science, Osaka University()
2nd Author's Name Hiroyuki SHIBATA
2nd Author's Affiliation NTT Basic Research Laboratories, NTT Corporation:Graduate School of Engineering Science, Osaka University
3rd Author's Name Hiroki TAKESUE
3rd Author's Affiliation NTT Basic Research Laboratories, NTT Corporation
4th Author's Name Yasuhiro TOKURA
4th Author's Affiliation NTT Basic Research Laboratories, NTT Corporation
5th Author's Name Nobuyuki IMOTO
5th Author's Affiliation Graduate School of Engineering Science, Osaka University
Date 2010-01-20
Paper # SCE2009-26
Volume (vol) vol.109
Number (no) 364
Page pp.pp.-
#Pages 5
Date of Issue