| Presentation | 2010-05-13 A Case Study of Evaluation Technique for Soft Error Tolerance on SRAMs-based FPGAs Tsuyoshi KIMURA, Noritaka KAI, Yoshiaki TSUTSUMI, Motoki AMAGASAKI, Morihiro KUGA, Toshinori SUEYOSHI, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | SRAM-based field programmable gate arrays(FPGAs)are vulnerable to a single event upset(SEU), which is induced by radiation effect. Therefore, the importance of the dependable implementation technique is increasing, and the accurate dependability analysis method is required in order to demonstrate their dependability. Most of present analysis technique is performed by using dynamic partial reconfiguration to emulate the soft-error. However, it takes long time to analyze the dependability because it requires many times of reconfiguration to complete the soft-error injection. In the present paper, we construct the soft-error estimation system to analyze the reliability and to reduce the estimation time. As a result of our experimentation for 16 bits full-adder and multiplier, we can estimate the dependability of implemented system. Moreover, the constructed system can reduce the estimation time. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | soft error / partial reconfiguration / SEU / self test |
| Paper # | RECONF2010-7 |
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| Conference Information | |
| Committee | RECONF |
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| Conference Date | 2010/5/6(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Reconfigurable Systems (RECONF) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Case Study of Evaluation Technique for Soft Error Tolerance on SRAMs-based FPGAs |
| Sub Title (in English) | |
| Keyword(1) | soft error |
| Keyword(2) | partial reconfiguration |
| Keyword(3) | SEU |
| Keyword(4) | self test |
| 1st Author's Name | Tsuyoshi KIMURA |
| 1st Author's Affiliation | Graduate School of Science and Technology, Kumamoto University() |
| 2nd Author's Name | Noritaka KAI |
| 2nd Author's Affiliation | Graduate School of Science and Technology, Kumamoto University |
| 3rd Author's Name | Yoshiaki TSUTSUMI |
| 3rd Author's Affiliation | Graduate School of Science and Technology, Kumamoto University |
| 4th Author's Name | Motoki AMAGASAKI |
| 4th Author's Affiliation | Graduate School of Science and Technology, Kumamoto University |
| 5th Author's Name | Morihiro KUGA |
| 5th Author's Affiliation | Graduate School of Science and Technology, Kumamoto University |
| 6th Author's Name | Toshinori SUEYOSHI |
| 6th Author's Affiliation | Graduate School of Science and Technology, Kumamoto University |
| Date | 2010-05-13 |
| Paper # | RECONF2010-7 |
| Volume (vol) | vol.110 |
| Number (no) | 32 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |