Presentation 2010-06-25
Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance 12
Shin-ichi WADA, Keiji KOSHIDA, Taketo SONODA, Saindaa NOROVLIN, Masayoshi KOTABE, Hiroaki KUBOTA, Koichiro SAWA,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the conditions that (1) frictional forces were 2.0N or 0.3N and (2) sliding amplitudes were ±5.0μm or ±10.0μm under the operation number of about 25milions. It was suggested that there was potentiality to make a model of the tendencies of contact variations in the primary stages in the above cases. It was studied that there were the parameters (sliding force and sliding amplitude) caused the relative displacements of the electrical contacts on the time-sequential fluctuations of the contact resistances. And it was suggested that the fretting corrosion model or sliding contact one would be applied to the fluctuation of contact resistance.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) electrical contact / micro-oscillation / contact resistance / sliding contact mechanism / sliding amplitude / sliding force
Paper # EMD2010-14,CPM2010-28,OME2010-33
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Conference Information
Committee EMD
Conference Date 2010/6/18(1days)
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Registration To Electromechanical Devices (EMD)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Degradation phenomenon of electrical contacts by hammering oscillating mechanism : Contact Resistance 12
Sub Title (in English)
Keyword(1) electrical contact
Keyword(2) micro-oscillation
Keyword(3) contact resistance
Keyword(4) sliding contact mechanism
Keyword(5) sliding amplitude
Keyword(6) sliding force
1st Author's Name Shin-ichi WADA
1st Author's Affiliation TMC System Co., Ltd.()
2nd Author's Name Keiji KOSHIDA
2nd Author's Affiliation TMC System Co., Ltd.
3rd Author's Name Taketo SONODA
3rd Author's Affiliation TMC System Co., Ltd.
4th Author's Name Saindaa NOROVLIN
4th Author's Affiliation TMC System Co., Ltd.
5th Author's Name Masayoshi KOTABE
5th Author's Affiliation TMC System Co., Ltd.
6th Author's Name Hiroaki KUBOTA
6th Author's Affiliation TMC System Co., Ltd.
7th Author's Name Koichiro SAWA
7th Author's Affiliation Keio University:Nippon Institute of Technology
Date 2010-06-25
Paper # EMD2010-14,CPM2010-28,OME2010-33
Volume (vol) vol.110
Number (no) 99
Page pp.pp.-
#Pages 6
Date of Issue