Presentation | 2010-06-21 Layout-aware Variation Modeling and Its Application to Op-Amp Design Kouta SHINOHARA, Mihoko HIDAKA, Qing DONG, Jing LI, Shigetoshi NAKATAKE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | As geometrical scaling of the transistor dimensions, such as feature size and supply voltage, has dominated the semiconductor industry for greater chip density, the variation analysis of transistor characteristic also becomes more critical important for analog integrated circuit design. In this paper, we present a model for the layout structure dependent variation according to the variation data got from a TEG (test element group) chip, then a correlation analysis is made between the result of Monte Carlo analysis based on this model and the experimental verification result for the offset voltage variation in a 90nm Op-Amp. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | analog layout design / layout-aware variation / Monte Carlo analysis / Op-Amp design |
Paper # | CAS2010-7,VLD2010-17,SIP2010-28,CST2010-7 |
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Committee | VLD |
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Conference Date | 2010/6/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | VLSI Design Technologies (VLD) |
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Language | ENG |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Layout-aware Variation Modeling and Its Application to Op-Amp Design |
Sub Title (in English) | |
Keyword(1) | analog layout design |
Keyword(2) | layout-aware variation |
Keyword(3) | Monte Carlo analysis |
Keyword(4) | Op-Amp design |
1st Author's Name | Kouta SHINOHARA |
1st Author's Affiliation | () |
2nd Author's Name | Mihoko HIDAKA |
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3rd Author's Name | Qing DONG |
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4th Author's Name | Jing LI |
4th Author's Affiliation | |
5th Author's Name | Shigetoshi NAKATAKE |
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Date | 2010-06-21 |
Paper # | CAS2010-7,VLD2010-17,SIP2010-28,CST2010-7 |
Volume (vol) | vol.110 |
Number (no) | 87 |
Page | pp.pp.- |
#Pages | 5 |
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