Presentation | 2010-06-25 A Class of Partial Thru Testable Sequential Circuits with Multiplexers Nobuya OKA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Acyclically testable sequential circuits are known to be practically testable, and a class, called partial thru testable, of acyclical testable circuits based on thru functions has been proposed. In this paper, we focus on multiplexers in partially thru testable sequential circuits, and show that a part of the condition, which is a sub-condition about the hold function of registers, can be relaxed by considering the function of multiplexers. A class of the sequential circuits that satisfy the relaxed condition includes the previous class of partially thru testable circuits. Experimental results show that a DFT based on the new class requires smaller area overhead and smaller test application time than that based on the previous class. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | thru testability / design for testability / time expansion model / combinational test generation algorithm |
Paper # | DC2010-9 |
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Conference Information | |
Committee | DC |
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Conference Date | 2010/6/18(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | |
Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Class of Partial Thru Testable Sequential Circuits with Multiplexers |
Sub Title (in English) | |
Keyword(1) | thru testability |
Keyword(2) | design for testability |
Keyword(3) | time expansion model |
Keyword(4) | combinational test generation algorithm |
1st Author's Name | Nobuya OKA |
1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
2nd Author's Name | Yuki YOSHIKAWA |
2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
3rd Author's Name | Hideyuki ICHIHARA |
3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
4th Author's Name | Tomoo INOUE |
4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
Date | 2010-06-25 |
Paper # | DC2010-9 |
Volume (vol) | vol.110 |
Number (no) | 106 |
Page | pp.pp.- |
#Pages | 5 |
Date of Issue |