Presentation 2010-06-25
A Class of Partial Thru Testable Sequential Circuits with Multiplexers
Nobuya OKA, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) Acyclically testable sequential circuits are known to be practically testable, and a class, called partial thru testable, of acyclical testable circuits based on thru functions has been proposed. In this paper, we focus on multiplexers in partially thru testable sequential circuits, and show that a part of the condition, which is a sub-condition about the hold function of registers, can be relaxed by considering the function of multiplexers. A class of the sequential circuits that satisfy the relaxed condition includes the previous class of partially thru testable circuits. Experimental results show that a DFT based on the new class requires smaller area overhead and smaller test application time than that based on the previous class.
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Keyword(in English) thru testability / design for testability / time expansion model / combinational test generation algorithm
Paper # DC2010-9
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Committee DC
Conference Date 2010/6/18(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Class of Partial Thru Testable Sequential Circuits with Multiplexers
Sub Title (in English)
Keyword(1) thru testability
Keyword(2) design for testability
Keyword(3) time expansion model
Keyword(4) combinational test generation algorithm
1st Author's Name Nobuya OKA
1st Author's Affiliation Graduate School of Information Sciences, Hiroshima City University()
2nd Author's Name Yuki YOSHIKAWA
2nd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Graduate School of Information Sciences, Hiroshima City University
Date 2010-06-25
Paper # DC2010-9
Volume (vol) vol.110
Number (no) 106
Page pp.pp.-
#Pages 5
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