Presentation 2010-03-28
A Case Study of Duplication Technique for SRAM-based FPGA
Kyohei SHIRAISHI, Motoki AMAGASAKI, Morihiro KUGA, Nobuhisa FUJIYAMA, Michihiko INUKAI, Toshinori SUEYOSHI,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) SRAM-based Field Programmable Gate Array(FPGA)is widely used in various applications such as industrial electronic devices, embedded systems and so on. However, SRAM-based FPGA has the problem of receiving the influence of Single Event Upset(SEU). Therefore, it is difficult to use it in the system that doesn't permit malfunction. The present paper describes a technique for high-reliability of the protection relay circuit using Duplication With Comparison(DWC)as a case study. We evaluate the area and recovery time about Full-DWC and Function-DWC. The results show that further possibilities of the Function-DWC.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) FPGA / Reliability / Duplication Technique / SEU / Protection Relay
Paper # CPSY2009-90,DC2009-87
Date of Issue

Conference Information
Committee DC
Conference Date 2010/3/19(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Case Study of Duplication Technique for SRAM-based FPGA
Sub Title (in English)
Keyword(1) FPGA
Keyword(2) Reliability
Keyword(3) Duplication Technique
Keyword(4) SEU
Keyword(5) Protection Relay
1st Author's Name Kyohei SHIRAISHI
1st Author's Affiliation Graduate School of Science and Technology, Kumamoto University()
2nd Author's Name Motoki AMAGASAKI
2nd Author's Affiliation Graduate School of Science and Technology, Kumamoto University
3rd Author's Name Morihiro KUGA
3rd Author's Affiliation Graduate School of Science and Technology, Kumamoto University
4th Author's Name Nobuhisa FUJIYAMA
4th Author's Affiliation Power Systems Protection & Control Department, Toshiba Corporation
5th Author's Name Michihiko INUKAI
5th Author's Affiliation Energy Automation Systems Engineering Dept., Toshiba Corporation
6th Author's Name Toshinori SUEYOSHI
6th Author's Affiliation Graduate School of Science and Technology, Kumamoto University
Date 2010-03-28
Paper # CPSY2009-90,DC2009-87
Volume (vol) vol.109
Number (no) 475
Page pp.pp.-
#Pages 6
Date of Issue