| Presentation | 2010-02-15 On Calculation of Delay Test Quality for Test Cubes and X-filling Shinji OKU, Seiji KAJIHARA, Yasuo SATO, Kohei MIYASE, Xiaoqing WEN, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns with unspecified values(Xs). Because the detectable delay size of each fault by a test cube is not fixed before assigning logic values to the Xs in the test cube, the proposed method only computes a range of the detectable delay values of the test patterns covered by the test cubes. By using the proposed method, we derive the lowest and the highest test quality of test patterns covered by the test cubes. Furthermore, we also propose a GA(genetic algorithm)-based method to generate fully specified test patterns with high test quality from test cubes. Experimental results for benchmark circuits show the effectiveness of the proposed methods. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | delay test / transition fault / SDQM / fault simulation / test cube |
| Paper # | DC2009-73 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/2/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Calculation of Delay Test Quality for Test Cubes and X-filling |
| Sub Title (in English) | |
| Keyword(1) | delay test |
| Keyword(2) | transition fault |
| Keyword(3) | SDQM |
| Keyword(4) | fault simulation |
| Keyword(5) | test cube |
| 1st Author's Name | Shinji OKU |
| 1st Author's Affiliation | Kyushu Institute of Technology:JST, CREST() |
| 2nd Author's Name | Seiji KAJIHARA |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 4th Author's Name | Kohei MIYASE |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| 5th Author's Name | Xiaoqing WEN |
| 5th Author's Affiliation | Kyushu Institute of Technology:JST, CREST |
| Date | 2010-02-15 |
| Paper # | DC2009-73 |
| Volume (vol) | vol.109 |
| Number (no) | 416 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |