| Presentation | 2010-02-15 A Test Compaction Oriented Control Point Insertion Method for Transition Faults Yoshitaka YUMOTO, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | The recent advances in semiconductor processing technology have resulted in the exponential increase in LSI circuit density. The number of test patterns increases in proportion to the number of gates on LSIs. In stuck-at fault testing, it is difficult to detect defects with timing delay and shorts between signal lines. Thus, in addition to detection of stuck-at faults, it is important to detect transition faults and bridging faults. In this paper, we propose a control point insertion method on broadside testing to reduce the number of test patterns for transition faults. It is considered that because the number of don't care bits in test patterns increases by control point insertion, the efficiency for test compaction is improved. Experimental results for ISCAS'89 benchmark circuits show that the proposed control point insertion method is effective to reduce the number of test patterns. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / broadside testing / test point insertion / control points / test compaction |
| Paper # | DC2009-72 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/2/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Compaction Oriented Control Point Insertion Method for Transition Faults |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | broadside testing |
| Keyword(3) | test point insertion |
| Keyword(4) | control points |
| Keyword(5) | test compaction |
| 1st Author's Name | Yoshitaka YUMOTO |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
| Date | 2010-02-15 |
| Paper # | DC2009-72 |
| Volume (vol) | vol.109 |
| Number (no) | 416 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |