Presentation 2010-02-15
Reduction of execution times and areas for delay measurement by subtraction
Toru TANABE, Hirohisa MINATO, Kentaroh KATOH, Kazuteru NAMBA, Hideo ITO,
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Abstract(in English) Since VLSI is in nanoscale size, high density and high speed in recent years, small-delay defects which change propagation time of a signal in the circuit become a serious problem. The techniques for measurement of the actual delay time of a path in the circuit are useful for detection of small-delay defects during manufacturing testing. This paper presents a method to reduce the execution times and the areas for the method of a delay measurement by using subtraction. Evaluation shows that the areas overhead and the execution times for the proposed method are about 20~35% smaller and 45~65% shorter than those for the conventional method respectively.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) VLSI / delay fault / testing / scan path / small-delay defect / measurement
Paper # DC2009-71
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Committee DC
Conference Date 2010/2/8(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Reduction of execution times and areas for delay measurement by subtraction
Sub Title (in English)
Keyword(1) VLSI
Keyword(2) delay fault
Keyword(3) testing
Keyword(4) scan path
Keyword(5) small-delay defect
Keyword(6) measurement
1st Author's Name Toru TANABE
1st Author's Affiliation Graduate School of Advanced Integration Science, Chiba University()
2nd Author's Name Hirohisa MINATO
2nd Author's Affiliation Department of Information and Image Science, Faculty of Engineering, Chiba University
3rd Author's Name Kentaroh KATOH
3rd Author's Affiliation Graduate School of Advanced Integration Science, Chiba University
4th Author's Name Kazuteru NAMBA
4th Author's Affiliation Graduate School of Advanced Integration Science, Chiba University
5th Author's Name Hideo ITO
5th Author's Affiliation Graduate School of Advanced Integration Science, Chiba University
Date 2010-02-15
Paper # DC2009-71
Volume (vol) vol.109
Number (no) 416
Page pp.pp.-
#Pages 6
Date of Issue