Presentation 2010-02-15
A Method of Reproducing Input/Output Error Trace on High-level Design for Hardware Debug Support
Yeonbok LEE, Tasuku NISHIHARA, Takeshi MATSUMOTO, Masahiro FUJITA,
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Abstract(in English) Post-silicon debugging of functional bugs is getting crucial due to the increasing complexity and the size of modern LSIs. Post-silicon debugging has been done by RTL simulation, but it has come to infeasible due to the limited simulation speed. In this paper, we propose a method to reproduce the input/output traces for behavior-level design from the original error input/output traces obtained in low levels including chip. The proposed method makes it possible to debug errors found in low-levels in high design abstraction-level, which improves the efficiency of debugging significantly with the high readability and reduced design size. We also demonstrate the experimental results obtained by applying our method to several design examples.
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Keyword(in English) High-level design / Debugging support / Post-silicon debug
Paper # DC2009-69
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Conference Date 2010/2/8(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Method of Reproducing Input/Output Error Trace on High-level Design for Hardware Debug Support
Sub Title (in English)
Keyword(1) High-level design
Keyword(2) Debugging support
Keyword(3) Post-silicon debug
1st Author's Name Yeonbok LEE
1st Author's Affiliation Department of Electronics Engineering, School of Engineering, University of Tokyo()
2nd Author's Name Tasuku NISHIHARA
2nd Author's Affiliation Department of Electronics Engineering, School of Engineering, University of Tokyo
3rd Author's Name Takeshi MATSUMOTO
3rd Author's Affiliation VLSI Design and Education Center, University of Tokyo
4th Author's Name Masahiro FUJITA
4th Author's Affiliation VLSI Design and Education Center, University of Tokyo:CREST, Japan Science and Technology Agency(JST)
Date 2010-02-15
Paper # DC2009-69
Volume (vol) vol.109
Number (no) 416
Page pp.pp.-
#Pages 6
Date of Issue