| Presentation | 2010-02-15 Modeling resistive open faults and generating their tests Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuta SHUDO, Yuji TAKAMUNE, Yuzo TAKAMATSU, Toshiyuki TSUTSUMI, Kouji YAMAZAKI, Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In order to solve the problem of signal integrity, we propose an extended delay fault model for modeling a resistive open fault. We use the three-dimensional electromagnetic software to analyze the behavior of a line with the resistive open. Under the extended delay fault model proposed in this paper, the size of the additional delay is depended on the signal transitions at the adjacent lines that are assigned by the test-pair. Under the launch on capture(LOC)test, we propose a method for generating the test-pairs for the resistive open faults by using the transition fault tests with don't cares. We demonstrated the experimental results to show that the proposed method is able to generate the test-pair for resistive open faults that cannot be detected by the given test-pairs for the transition faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | resistive open fault / test pattern generation / extended delay fault model / adjacent lines |
| Paper # | DC2009-68 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/2/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Modeling resistive open faults and generating their tests |
| Sub Title (in English) | |
| Keyword(1) | resistive open fault |
| Keyword(2) | test pattern generation |
| Keyword(3) | extended delay fault model |
| Keyword(4) | adjacent lines |
| 1st Author's Name | Hiroshi TAKAHASHI |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Yoshinobu HIGAMI |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Yuta SHUDO |
| 3rd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 4th Author's Name | Yuji TAKAMUNE |
| 4th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 5th Author's Name | Yuzo TAKAMATSU |
| 5th Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 6th Author's Name | Toshiyuki TSUTSUMI |
| 6th Author's Affiliation | Meiji University |
| 7th Author's Name | Kouji YAMAZAKI |
| 7th Author's Affiliation | Meiji University |
| 8th Author's Name | Hiroyuki YOTSUYANAGI |
| 8th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
| 9th Author's Name | Masaki HASHIZUME |
| 9th Author's Affiliation | Graduate School of Advanced Technology and Science, the University of Tokushima |
| Date | 2010-02-15 |
| Paper # | DC2009-68 |
| Volume (vol) | vol.109 |
| Number (no) | 416 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |