| Presentation | 2010-02-15 Study on a Test Generation Method for Transition Fault Using Multi Cycle Capture Test Hiroshi OGAWA, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, Kouji YAMAZAKI, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Overtesting induces unnecessary yield loss. Untestable faults have no effect on normal functions of circuits. However, in scan testing, untestable faults may be detected through scan chains. Detected untestable faults cause overtesting. Untestable faults consist of uncontrollable faults, unobservable faults, and uncontrollable and unobservable faults. Uncontrollable faults may be detected under invalid states through scan chains by shift-in operations. Unobservable faults cannot be observed at primary outputs, but their effects may be propagated to scan flip-flops. Thus, unobservable faults may be detected through scan chains by shift-out operations. Several methods to reduce the number of detected untestable faults were recently proposed. These methods identify invalid states and generate test patterns avoiding invalid states. As the result, the number of detected uncontrollable faults was reduced. However, they cannot reduce the number of detected unobservable faults. In this paper, both uncontrollable and unobservable faults are identified using a multi-cycle capture test generation method. We evaluate the relationship between the numbers of untestable faults and the fault excitation time for ISCAS'89 benchmark circuits, and also evaluate factors that untestable faults are identified. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | transition faults / over testing / time expansion models / multi-cycle capture test / untestable faults |
| Paper # | DC2009-67 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2010/2/8(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on a Test Generation Method for Transition Fault Using Multi Cycle Capture Test |
| Sub Title (in English) | |
| Keyword(1) | transition faults |
| Keyword(2) | over testing |
| Keyword(3) | time expansion models |
| Keyword(4) | multi-cycle capture test |
| Keyword(5) | untestable faults |
| 1st Author's Name | Hiroshi OGAWA |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
| 4th Author's Name | Kouji YAMAZAKI |
| 4th Author's Affiliation | School of Information and Communication, Meiji University |
| Date | 2010-02-15 |
| Paper # | DC2009-67 |
| Volume (vol) | vol.109 |
| Number (no) | 416 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |