| Presentation | 2010-02-15 A Statistical Method of Small Iddq Variance Outlier Detection Yoshiyuki NAKAMURA, Masashi TANAKA, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With manufacturing process advances, Iddq test becomes difficult due to its variance. Though ΔIddq or various methods were proposed to overcome it, Iddq testing is still difficult because the factor of Iddq variance is increasing and the most of faults affect only small Iddq differences. In this paper, we propose Iddq testing using Mahalanobis distance to identify outliers of multi-dimensional Iddq variance. We also report the evaluation results of our method using real manufacturing data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Iddq test / Statistical test / adaptive test / Mahalanobis distance |
| Paper # | DC2009-65 |
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| Committee | DC |
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| Conference Date | 2010/2/8(1days) |
| Place (in Japanese) | (See Japanese page) |
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| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Statistical Method of Small Iddq Variance Outlier Detection |
| Sub Title (in English) | |
| Keyword(1) | Iddq test |
| Keyword(2) | Statistical test |
| Keyword(3) | adaptive test |
| Keyword(4) | Mahalanobis distance |
| 1st Author's Name | Yoshiyuki NAKAMURA |
| 1st Author's Affiliation | Test and Analysis Engineering Division, Manufacturing Operations Unit NEC Electronics Corporation() |
| 2nd Author's Name | Masashi TANAKA |
| 2nd Author's Affiliation | Test and Analysis Engineering Division, Manufacturing Operations Unit NEC Electronics Corporation |
| Date | 2010-02-15 |
| Paper # | DC2009-65 |
| Volume (vol) | vol.109 |
| Number (no) | 416 |
| Page | pp.pp.- |
| #Pages | 5 |
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