| Presentation | 2009-12-04 A Path Selection Method of Delay Test for Transistor Aging Mitsumasa NODA, Seiji KAJIHARA, Yasuo SATO, Kohei MIYASE, Xiaoqing WEN, Takaya MIURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the advanced VLSI process technology, it is important for reliability of VLSIs to deal with faults caused by aging. The speed of aging depends on not only the function of the circuit but also environment where the circuit is used. Hence detection of aging that would make a failure prefers to test on the field after shipping the VLSIs. This paper presents a method for selecting paths to be tested for delay degradation caused by NBTI under BIST-based self testing. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Aging / Negative Bias Temperature Instability / Delay Fault / Path selection |
| Paper # | VLD2009-65,DC2009-52 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Path Selection Method of Delay Test for Transistor Aging |
| Sub Title (in English) | |
| Keyword(1) | Aging |
| Keyword(2) | Negative Bias Temperature Instability |
| Keyword(3) | Delay Fault |
| Keyword(4) | Path selection |
| 1st Author's Name | Mitsumasa NODA |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Seiji KAJIHARA |
| 2nd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 3rd Author's Name | Yasuo SATO |
| 3rd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 4th Author's Name | Kohei MIYASE |
| 4th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 5th Author's Name | Xiaoqing WEN |
| 5th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
| 6th Author's Name | Takaya MIURA |
| 6th Author's Affiliation | Faculty of System Design, Tokyo Metropolitan University:JST CREST |
| Date | 2009-12-04 |
| Paper # | VLD2009-65,DC2009-52 |
| Volume (vol) | vol.109 |
| Number (no) | 316 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |