Presentation 2009-12-04
Logic stabilization way of open fault with unsuitable logic : Aim in simple diagnosis technology
Masaru SANADA, Keiji HASHIDA, Taiki YASUTOMI,
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Abstract(in English) An experiment for stabilization of output logic brought by floating gate fault with unsuitable electric value has been executed. The method is the way to apply outside impulse to LSI with gate open fault. The impulses are laser irradiation and electric field impression. The experimental result is that the former impulse brings stabilization of output logic value, regardless of a couple of electrical features brought by gate floating state, and the latter brings the change of electric value wrapped over electric property of floating gate. These phenomenon are applied to detect fault portion with gate open, and to assist fault diagnosis. For the fault diagnosis technology based on transistor level, the stabilized logic value is embedded in fault circuit and high accuracy candidate fault portions are detected.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Floating gate fault / Stabilized logic value / Fault diagnosis technology / Laser irradiation / Electric field impression
Paper # VLD2009-64,DC2009-51
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Committee DC
Conference Date 2009/11/25(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Logic stabilization way of open fault with unsuitable logic : Aim in simple diagnosis technology
Sub Title (in English)
Keyword(1) Floating gate fault
Keyword(2) Stabilized logic value
Keyword(3) Fault diagnosis technology
Keyword(4) Laser irradiation
Keyword(5) Electric field impression
1st Author's Name Masaru SANADA
1st Author's Affiliation Dept. Electronic and Photonic Systems Engineering, Kochi University of Technology()
2nd Author's Name Keiji HASHIDA
2nd Author's Affiliation System LSI Department, Renesas Design Co,.
3rd Author's Name Taiki YASUTOMI
3rd Author's Affiliation Dept. Electronic and Photonic Systems Engineering, Kochi University of Technology
Date 2009-12-04
Paper # VLD2009-64,DC2009-51
Volume (vol) vol.109
Number (no) 316
Page pp.pp.-
#Pages 6
Date of Issue