| Presentation | 2009-12-04 A Test Compaction Oriented Don't Care Identification Method Motohiro WAKAZONO, Toshinori HOSOKAWA, Masayoshi YOSHIMURA, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In recent year, the growing density and complexity for VLSIs cause an increase in the number of test pattern and an increase in the number of fault models to be tested high quality and low cost test pattern are required to solve their problems. One of test generation methods to get high quality and low cost test pattern is a don't care identification technique. Therefore, it may have a bad influence an application specific fields like a test compaction. In this paper, we propose a test compaction oriented don't care identification method which controls care bits in a test set. Experimental results for ITC'99 benchmark circuits and ISCAS'89 benchmark circuits show that a given test set can be efficiently compacted the proposed method. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | don't care identification / care bit distribution / test compaction / essential faults |
| Paper # | VLD2009-62,DC2009-49 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Test Compaction Oriented Don't Care Identification Method |
| Sub Title (in English) | |
| Keyword(1) | don't care identification |
| Keyword(2) | care bit distribution |
| Keyword(3) | test compaction |
| Keyword(4) | essential faults |
| 1st Author's Name | Motohiro WAKAZONO |
| 1st Author's Affiliation | Graduate School of Industrial Technology, Nihon University() |
| 2nd Author's Name | Toshinori HOSOKAWA |
| 2nd Author's Affiliation | College of Industrial Technology, Nihon University |
| 3rd Author's Name | Masayoshi YOSHIMURA |
| 3rd Author's Affiliation | Graduate School of Information Science and Electrical Engineering, Kyushu University |
| Date | 2009-12-04 |
| Paper # | VLD2009-62,DC2009-49 |
| Volume (vol) | vol.109 |
| Number (no) | 316 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |