Presentation 2009-12-04
Increasing Yield Using Partially-Programmable Circuits
Shigeru YAMASHITA, Hiroaki YOSHIDA, Masahiro FUJITA,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) This paper proposes to use Partially-Programmable Circuits(PPCs)which are obtained from conventional logic circuits by replacing their sub-circuits with LUTs. If a connection in a PPC becomes redundant by changing the functionality of some LUTs, the connection is considered to be robust to defects because even if there are some defects at the connection, the circuit works properly by changing the functionality of some LUTs appropriately. To increase the number of such robust connections, we add some redundant connections to LUTs. We find such redundant connection by using functional flexibility represented by SPFDs and/or CSPFs. From the result of our preliminary experiments, we consider our approach is promising.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) yield / LUT / Partially-Programmable Circuit(PPC) / SPFD
Paper # VLD2009-59,DC2009-46
Date of Issue

Conference Information
Committee DC
Conference Date 2009/11/25(1days)
Place (in Japanese) (See Japanese page)
Place (in English)
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair
Vice Chair
Secretary
Assistant

Paper Information
Registration To Dependable Computing (DC)
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Increasing Yield Using Partially-Programmable Circuits
Sub Title (in English)
Keyword(1) yield
Keyword(2) LUT
Keyword(3) Partially-Programmable Circuit(PPC)
Keyword(4) SPFD
1st Author's Name Shigeru YAMASHITA
1st Author's Affiliation College of Information Science and Engineering, Ritsumeikan University()
2nd Author's Name Hiroaki YOSHIDA
2nd Author's Affiliation VLSI Design and Education Center(VDEC), University of Tokyo
3rd Author's Name Masahiro FUJITA
3rd Author's Affiliation VLSI Design and Education Center(VDEC), University of Tokyo
Date 2009-12-04
Paper # VLD2009-59,DC2009-46
Volume (vol) vol.109
Number (no) 316
Page pp.pp.-
#Pages 6
Date of Issue