Presentation | 2009-12-03 Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity Isao BEPPU, Kohei MIYASE, Yuta YAMATO, Xiaoqing WEN, Seiji KAJIHARA, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Increase of power dissipation and IR-drop during scan-shifting operation and/or capture operation is still challenging problem for LSI testing. It is known that power dissipation during scan-shifting can be reduced with DFT techniques. As for capture power reduction, post-ATPG test modification is the preferable solution since it does not cause circuit modification, test data inflation and post-ATPG modification consists of X-identification and X-filling. Although the existing X-identification identifies a plenty number of X-bits, some test cubes have a relatively small number of X-bits. Usually a desirable number of X-bits for each test cube must be different depending on X-filling and its purposes. In this paper we propose a new X-identification to control the X-bit distribution according to a given required distribution. Experimental results demonstrate the proposed method to optimize the percentage of X-bits to reduce switching activity. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | ATPG / X-bit / X-identification / X-filling / post-ATPG test modification |
Paper # | VLD2009-55,DC2009-42 |
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Conference Information | |
Committee | DC |
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Conference Date | 2009/11/25(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Optimizing Don't-Care Bit Rate Derived from X-Identification for Reduction of Switching Activity |
Sub Title (in English) | |
Keyword(1) | ATPG |
Keyword(2) | X-bit |
Keyword(3) | X-identification |
Keyword(4) | X-filling |
Keyword(5) | post-ATPG test modification |
1st Author's Name | Isao BEPPU |
1st Author's Affiliation | Kyushu Institute of Technology() |
2nd Author's Name | Kohei MIYASE |
2nd Author's Affiliation | Kyushu Institute of Technology:JST CREST |
3rd Author's Name | Yuta YAMATO |
3rd Author's Affiliation | Kyushu Institute of Technology |
4th Author's Name | Xiaoqing WEN |
4th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
5th Author's Name | Seiji KAJIHARA |
5th Author's Affiliation | Kyushu Institute of Technology:JST CREST |
Date | 2009-12-03 |
Paper # | VLD2009-55,DC2009-42 |
Volume (vol) | vol.109 |
Number (no) | 316 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |