| Presentation | 2009-12-03 A Yield Model with Testability and Repairability Yujiro AMANO, Yuki YOSHIKAWA, Hideyuki ICHIHARA, Tomoo INOUE, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | For deep-submicron technology, the increase in transitive and permanent faults of LSIs is a critical problem due to the considerable loss of production yield and the large increase in defect level. In this paper, we focus on repairable and testable designs of logic circuits, and propose a new yield model, which represents the impacts of these designs on production yield and defect level. The proposed model is applied to three testable designs and one repairable design to clarify the relationship between the designs and the production cost / reliability of LSIs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | yield / defect level / design-for-testability / repairable design |
| Paper # | VLD2009-54,DC2009-41 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2009/11/25(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Yield Model with Testability and Repairability |
| Sub Title (in English) | |
| Keyword(1) | yield |
| Keyword(2) | defect level |
| Keyword(3) | design-for-testability |
| Keyword(4) | repairable design |
| 1st Author's Name | Yujiro AMANO |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Yuki YOSHIKAWA |
| 2nd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Hideyuki ICHIHARA |
| 3rd Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| 4th Author's Name | Tomoo INOUE |
| 4th Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University |
| Date | 2009-12-03 |
| Paper # | VLD2009-54,DC2009-41 |
| Volume (vol) | vol.109 |
| Number (no) | 316 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |