Presentation 2009-12-03
A Quantitative Evaluation of Security for Scan-based Side Channel Attack and Countermeasures
Yuma ITO, Masayoshi YOSHIMURA, Hiroto YASUURA,
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Abstract(in English) There is a potential that the secret information on an encryption LSI is leaked from a scan chain. There are many countermeasures against scan based attack. When we design a circuit, we need to evaluate a security of the circuit applied these countermeasures quantitatively and choose the best one. However, it is not discussed a quantitative security evaluation against scan based attack so much. In this paper, we propose a quantitative security evaluation method. In this method, we evaluate security using a mutual information between the obtained information which an attacker can obtain and the secret information which an attacker wants to get as an evaluation index. We evaluate securities of DES circuits with different configurations using the proposed method and show quantitatively that the security of a circuit depends on its configuration.
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Keyword(in English) scan based attack / security / mutual information / DES / BIST
Paper # VLD2009-52,DC2009-39
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Committee DC
Conference Date 2009/11/25(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Quantitative Evaluation of Security for Scan-based Side Channel Attack and Countermeasures
Sub Title (in English)
Keyword(1) scan based attack
Keyword(2) security
Keyword(3) mutual information
Keyword(4) DES
Keyword(5) BIST
1st Author's Name Yuma ITO
1st Author's Affiliation Graduate School of Information Science and Electrical Engineering, Kyushu University()
2nd Author's Name Masayoshi YOSHIMURA
2nd Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
3rd Author's Name Hiroto YASUURA
3rd Author's Affiliation Faculty of Information Science and Electrical Engineering, Kyushu University
Date 2009-12-03
Paper # VLD2009-52,DC2009-39
Volume (vol) vol.109
Number (no) 316
Page pp.pp.-
#Pages 6
Date of Issue