Presentation | 2010/3/19 Detection of Abnormality by Using Waveform Time-series Classifiers on Low-Quality Sensor Data Ken Ueno, Topon Kumar Paul, Makoto Sato, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | To detect abnormality in a target object, multiple sensors are widely used in various application domains. However, when many sensors are necessary for simultaneous monitoring of the target object, use of high-quality sensors may not be feasible due to the high costs of the sensors; instead, low-quality sensors are widely used in many industrial applications. In this paper, we propose a decision fusion technique called k-Nearest Neighbor-based Bayesian Classifier(k-NNBC)that enables accurate anomaly detection using multivariate sensor data. In our empirical evaluations on the angular bump related anomaly detection problem using a 3-axis accelerometer, we have found that the k-NNBC outperforms the widely-used k-Nearest Neighbor(k-NN)classifier with Dynamic Time Warping(DTW)distance measure; especially on low-specification configurations, the k-NNBC improves the accuracy by approximately 12.5% on the average, which shows the effectiveness of the proposed method. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Anomaly Detection / Decision Fusion / k-Nearest Neighbor-based Bayesian Classifier / Dynamic Time Warping |
Paper # | SSS2009-35 |
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Committee | SSS |
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Conference Date | 2010/3/19(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Safety (SSS) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Detection of Abnormality by Using Waveform Time-series Classifiers on Low-Quality Sensor Data |
Sub Title (in English) | |
Keyword(1) | Anomaly Detection |
Keyword(2) | Decision Fusion |
Keyword(3) | k-Nearest Neighbor-based Bayesian Classifier |
Keyword(4) | Dynamic Time Warping |
1st Author's Name | Ken Ueno |
1st Author's Affiliation | System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corporation() |
2nd Author's Name | Topon Kumar Paul |
2nd Author's Affiliation | System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corporation |
3rd Author's Name | Makoto Sato |
3rd Author's Affiliation | System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corporation |
Date | 2010/3/19 |
Paper # | SSS2009-35 |
Volume (vol) | vol.109 |
Number (no) | 473 |
Page | pp.pp.- |
#Pages | 4 |
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