| Presentation | 2010-02-26 Phase noise compensated optical frequency domain reflectometry with higher spatial resolution Yusuke KOSHIKIYA, Xinyu FAN, Fumihiko ITO, |
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| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We demonstrated sub-cm spatial resolution reflectometry over a 10 km range based on PNC-OFDR employing optical 3rd order sideband as a test light for a broader external frequency sweeping. It was theoretically derived that the 3rd order sideband was generated by two LN-IMs arranged in series. The obtained spatial resolution was sub-cm over 10 km, and the sensitivity (relative to the Rayleigh backscattering level) was about -25 dB for all measurements. This means that the concatenative reference method for PNC-OFDR with 3rd order sideband sweeping worked very well over a 10 km range. It appears to be almost impossible to realize both a sub-cm spatial resolution and a sensitivity of -25 dB simultaneously over 10 km with any conventional reflectometry technique. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | optical frequency domain reflectometry (OFDR)We demonstrated sub-cm spatial resolution reflectometry over a 10 km range based on PNC-OFDR employing optical 3rd order sideband as a test light for a broader external frequency sweeping. It was theoretically derived that the 3rd order sideband was generated by two LN-IMs arranged in series. The obtained spatial resolution was sub-cm over 10 km, and the sensitivity (relative to the Rayleigh backscattering level) was about -25 dB for all measurements. This means that the concatenative reference method for PNC-OFDR with 3rd order sideband sweeping worked very well over a 10 km range. It appears to be almost impossible to realize both a sub-cm spatial resolution and a sensitivity of -25 dB simultaneously over 10 km with any conventional reflectometry technique. / optical frequency domain reflectometry (OFDR) / phase noise / phase noise compensation / maintenance |
| Paper # | OFT2009-94,OPE2009-235 |
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| Committee | OFT |
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| Conference Date | 2010/2/19(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Optical Fiber Technology (OFT) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Phase noise compensated optical frequency domain reflectometry with higher spatial resolution |
| Sub Title (in English) | |
| Keyword(1) | optical frequency domain reflectometry (OFDR)We demonstrated sub-cm spatial resolution reflectometry over a 10 km range based on PNC-OFDR employing optical 3rd order sideband as a test light for a broader external frequency sweeping. It was theoretically derived that the 3rd order sideband was generated by two LN-IMs arranged in series. The obtained spatial resolution was sub-cm over 10 km, and the sensitivity (relative to the Rayleigh backscattering level) was about -25 dB for all measurements. This means that the concatenative reference method for PNC-OFDR with 3rd order sideband sweeping worked very well over a 10 km range. It appears to be almost impossible to realize both a sub-cm spatial resolution and a sensitivity of -25 dB simultaneously over 10 km with any conventional reflectometry technique. |
| Keyword(2) | optical frequency domain reflectometry (OFDR) |
| Keyword(3) | phase noise |
| Keyword(4) | phase noise compensation |
| Keyword(5) | maintenance |
| 1st Author's Name | Yusuke KOSHIKIYA |
| 1st Author's Affiliation | NTT Access Network Service Systems Laboratories, NTT Corporation() |
| 2nd Author's Name | Xinyu FAN |
| 2nd Author's Affiliation | NTT Access Network Service Systems Laboratories, NTT Corporation |
| 3rd Author's Name | Fumihiko ITO |
| 3rd Author's Affiliation | NTT Access Network Service Systems Laboratories, NTT Corporation |
| Date | 2010-02-26 |
| Paper # | OFT2009-94,OPE2009-235 |
| Volume (vol) | vol.109 |
| Number (no) | 428 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |